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"Reverse-order-restoration-based static test compaction for synchronous ..."
Ruifeng Guo, Sudhakar M. Reddy, Irith Pomeranz (2003)
- Ruifeng Guo, Sudhakar M. Reddy, Irith Pomeranz:
Reverse-order-restoration-based static test compaction for synchronous sequential circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 22(3): 293-304 (2003)
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