Takayasu Sakurai, Bill Lin, A. Richard Newton: Fast simulated diffusion: an optimization algorithm for multiminimum problems and its application to MOSFET model parameter extraction. 228-234
Yusuf Leblebici, Sung-Mo Kang: Modeling of nMOS transistors for simulation of hot-carrier-induced device and circuit degradation. 235-246
Irith Pomeranz, Zvi Kohavi: A limited exponential complexity algorithm for increasing the testability of digital circuits by testing-module insertion. 247-259
Joohyun Jin, Jerry G. Fossum: Non-quasi-static modeling/implementation of BJT current crowding for seminumerical mixed-mode device/circuit simulation. 759-767
André Ivanov, Yervant Zorian: Count-based BIST compaction schemes and aliasing probability computation. 768-777
Michael J. Bryan, Srinivas Devadas, Kurt Keutzer: Necessary and sufficient conditions for hazard-free robust transistor stuck-open-fault testability in multilevel networks. 800-803
Volume 11, Number 7, July 1992
Tom Dhaene, Daniel De Zutter: Selection of lumped element models for coupled lossy transmission lines. 805-815
Mary L. Bailey: A time-based model for investigating parallel logic-level simulation. 816-824
Kevin S. Eshbaugh: Generation of correlated parameters for statistical circuit simulation. 1198-1206
Bogdan J. Falkowski, Ingo Schäfer, Marek A. Perkowski: Effective computer methods for the calculation of Rademacher-Walsh spectrum for completely and incompletely specified Boolean functions. 1207-1226
Mark William Kahrs: Silicon compilation of very high level language. 1227-1246
Andrew B. Kahng, Gabriel Robins: On the performance bounds for a class of rectilinear Steiner tree heuristics in arbitrary dimension. 1462-1465
Volume 11, Number 12, December 1992
Carl Pixley: A theory and implementation of sequential hardware equivalence. 1469-1478
Richard W. Thaik, Ngee Lek, Sung-Mo Kang: A new global router using zero-one integer linear programming techniques for sea-of-gates and custom logic arrays. 1479-1494
Shan-Ping Chin, Ching-Yuan Wu: A new methodology for two-dimensional numerical simulation of semiconductor devices. 1508-1521
H.-C. Chow, W.-S. Feng, James B. Kuo: An improved analytical short-channel MOSFET model valid in all regions of operating for analog/digital circuit simulation. 1522-1528
Shiu-Kai Chin: Verified functions for generating signed-binary arithmetic hardware. 1529-1558
Srinivas Devadas, Kurt Keutzer: Validatable nonrobust delay-fault testable circuits via logic synthesis. 1559-1573