Volume 21,
Number 1,
January/February 2004
EIC Message
- Rajesh Gupta:
From the Editor in Chief: Predictability in Design and Manufacturing.
1-
Features
Nontheme Features
Departments
The Last Byte
Volume 21,
Number 2,
March/April 2004
EIC Message
- Rajesh Gupta:
From the EIC: Past successes, future challenges.
77-78
Features
- Roy L. Russo:
Serving a growing community: How D&T began.
79-
- Magdy S. Abadir, Li-C. Wang:
Guest Editors' Introduction: The Verification and Test of Complex Digital ICs.
80-82
- Allon Adir, Eli Almog, Laurent Fournier, Eitan Marcus, Michal Rimon, Michael Vinov, Avi Ziv:
Genesys-Pro: Innovations in Test Program Generation for Functional Processor Verification.
84-93
- Carl Scafidi, J. Douglas Gibson, Rohit Bhatia:
Validating the Itanium 2 Exception Control Unit: A Unit-Level Approach.
94-101
- Fulvio Corno, Ernesto Sánchez, Matteo Sonza Reorda, Giovanni Squillero:
Automatic Test Program Generation: A Case Study.
102-109
- Chia-Chih Yen, Jing-Yang Jou, Kuang-Chien Chen:
A Divide-and-Conquer-Based Algorithm for Automatic Simulation Vector Generation.
111-120
- Prabhat Mishra, Nikil Dutt, Narayanan Krishnamurthy, Magdy S. Abadir:
A Top-Down Methodology for Microprocessor Validation.
122-131
- Ganapathy Parthasarathy, Madhu K. Iyer, Kwang-Ting Cheng, Li-C. Wang:
Safety Property Verification Using Sequential SAT and Bounded Model Checking.
132-143
- Rob Aitken, Stefan Eichenberger, Gary Maier, Sandip Kundu, Hank Walker:
ITC 2003 Roundtable: Design for Manufacturability.
144-156
Departments
The Last Byte
- Prab Varma:
Verification evolution or industrial revolution?
168-
Volume 21,
Number 3,
May/June 2004
EIC Message
- Rajesh Gupta:
From the EIC: The next EDA challenge - Design for manufacturability.
169-
D&T:
20 Years of Service
Panel Summaries
Features
- Yervant Zorian, Dimitris Gizopoulos, Cary Vandenberg, Philippe Magarshack:
Guest Editors' Introduction: Design for Yield and Reliability.
177-182
- Juan Antonio Carballo, Sani R. Nassif:
Impact of Design-Manufacturing Interface on SoC Design Methodologies.
183-191
- Alessandra Nardi, Alberto L. Sangiovanni-Vincentelli:
Logic Synthesis for Manufacturability.
192-199
- Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian:
SoC Yield Optimization via an Embedded-Memory Test and Repair Infrastructure.
200-207
- Davide Appello, Alessandra Fudoli, Katia Giarda, Vincenzo Tancorre, Emil Gizdarski, Ben Mathew:
Understanding Yield Losses in Logic Circuits.
208-215
- Melvin A. Breuer, Sandeep K. Gupta, T. M. Mak:
Defect and Error Tolerance in the Presence of Massive Numbers of Defects.
216-227
- Subhasish Mitra, Wei-Je Huang, Nirmal R. Saxena, Shu-Yi Yu, Edward J. McCluskey:
Reconfigurable Architecture for Autonomous Self-Repair.
228-240
- T. M. Mak, Angela Krstic, Kwang-Ting (Tim) Cheng, Li-C. Wang:
New Challenges in Delay Testing of Nanometer, Multigigahertz Designs.
241-247
- Bhaskar Chatterjee, Manoj Sachdev, Ali Keshavarzi:
DFT for Delay Fault Testing of High-Performance Digital Circuits.
248-258
DAC Watch
DATC Newsletter
- Design Automation Technical Committee Newsletter.
263-
The Last Byte
Volume 21,
Number 4,
July/August 2004
EIC Message
- From the EIC: Manufacturing test woes.
269-270
Features
- Sumit DasGupta:
Looking back, looking around.
271-273
- André Ivanov, Fabrizio Lombardi, Cecilia Metra:
Guest Editors' Introduction: Advances in VLSI Testing at MultiGbps Rates.
274-276
- T. M. Mak, Mike Tripp, Anne Meixner:
Testing Gbps Interfaces without a Gigahertz Tester.
278-286
- David C. Keezer, Dany Minier, Marie-Christine Caron:
Multiplexing ATE Channels for Production Testing at 2.5 Gbps.
288-301
- Nelson Ou, Touraj Farahmand, Andy Kuo, Sassan Tabatabaei, André Ivanov:
Jitter Models for the Design and Test of Gbps-Speed Serial Interconnects.
302-313
- Stephen K. Sunter, Aubin Roy:
On-Chip Digital Jitter Measurement, from Megahertz to Gigahertz.
314-321
Special Features
Departments
- Conference Reports.
339-341
- Panel Summaries.
342-
- John Willis, Joe Damore:
Design automation Technical Committee Newsletter.
343-
- Rob Aitken:
Test at Gbps: Megaproblem or micromanagement?
344-
Volume 21,
Number 5,
September/October 2004
EIC Message
- Rajesh Gupta:
Silicon for embedded multimedia processing.
345-
Conference Reports
- Conference Reports.
350-353
Features
- Radu Marculescu, Petru Eles:
Guest Editors' Introduction: Designing Real-Time Embedded Multimedia Systems.
354-356
- Chaeseok Im, Soonhoi Ha:
Energy Optimization for Latency- and Quality-Constrained Video Applications.
358-366
- Alexander Maxiaguine, Samarjit Chakraborty, Simon Künzli, Lothar Thiele:
Evaluating Schedulers for Multimedia Processing on Buffer-Constrained SoC Platforms.
368-377
- Paul Marchal, Francky Catthoor, Davide Bruni, Luca Benini, José Ignacio Gómez, Luis Piñuel:
Integrated Task Scheduling and Data Assignment for SDRAMs in Dynamic Applications.
378-387
- Hojun Shim, Naehyuck Chang, Massoud Pedram:
A Backlight Power Management Framework for Battery-Operated Multimedia Systems.
388-396
- Sudeep Pasricha, Manev Luthra, Shivajit Mohapatra, Nikil D. Dutt, Nalini Venkatasubramanian:
Dynamic Backlight Adaptation for Low-Power Handheld Devices.
398-405
- Haris Lekatsas, Jörg Henkel, Srimat T. Chakradhar, Venkata Jakkula:
Cypress: Compression and Encryption of Data and Code for Embedded Multimedia Systems.
406-415
Special Features
Departments
Volume 21,
Number 6,
November-December 2004
EIC Message
Features
- Carl Pixley, Sharad Malik:
Guest Editors' Introduction: Exploring Synergies for Design Verification.
461-463
- Martin Zambaldi, Wolfgang Ecker, Renate Henftling, Matthias Bauer:
A Layered Adaptive Verification Platform for Simulation, Test, and Emulation.
464-471
- Serdar Tasiran, Yuan Yu, Brannon Batson:
Linking Simulation with Formal Verification at a Higher Level.
472-482
- Young-Il Kim, Chong-Min Kyung:
TPartition: Testbench Partitioning for Hardware-Accelerated Functional Verification.
484-493
- Jayanta Bhadra, Narayanan Krishnamurthy, Magdy S. Abadir:
Enhanced Equivalence Checking: Toward a Solidarity of Functional Verification and Manufacturing Test Generation.
494-502
Special Features
- Shuo Sheng, Michael S. Hsiao:
Success-Driven Learning in ATPG for Preimage Computation.
504-512
- Ioannis Papaefstathiou:
Titan II: An IPcomp Processor for 10-Gbps Networks.
514-523
- Frederic Worm, Paolo Ienne, Patrick Thiran, Giovanni De Micheli:
On-Chip Self-Calibrating Communication Techniques Robust to Electrical Parameter Variations.
524-535
- Marcel A. Kossel, Martin L. Schmatz:
Jitter Measurements of High-Speed Serial Links.
536-543
- Glenn H. Chapman, Sunjaya Djaja, Desmond Y. H. Cheung, Yves Audet, Israel Koren, Zahava Koren:
A Self-Correcting Active Pixel Sensor Using Hardware and Software Correction.
544-551
- Fernanda Lima Kastensmidt, Gustavo Neuberger, Renato Fernandes Hentschke, Luigi Carro, Ricardo Reis:
Designing Fault-Tolerant Techniques for SRAM-Based FPGAs.
552-562
- Naran Sirisantana, Bipul Chandra Paul, Kaushik Roy:
Enhancing Yield at the End of the Technology Roadmap.
563-571
- Ikhwan Lee, Yongseok Choi, Youngjin Cho, Yongsoo Joo, Hyeonmin Lim, Hyung Gyu Lee, Hojun Shim, Naehyuck Chang:
Web-Based Energy Exploration Tool for Embedded Systems.
572-586
Departments
The Last Byte
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