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"Guest Editors' Introduction: Advances in VLSI Testing at MultiGbps Rates."

André Ivanov, Fabrizio Lombardi, Cecilia Metra (2004)

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DOI: 10.1109/MDT.2004.31

access: closed

type: Journal Article

metadata version: 2020-05-17

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  persistent URL:
  - https://dblp.org/rec/journals/dt/IvanovLM04
André Ivanov, Fabrizio Lombardi, Cecilia Metra:
Guest Editors' Introduction: Advances in VLSI Testing at MultiGbps Rates. IEEE Des. Test Comput. 21(4): 274-276 (2004)

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