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"Guest Editors' Introduction: Design for Yield and Reliability."
Yervant Zorian et al. (2004)
- Yervant Zorian, Dimitris Gizopoulos, Cary Vandenberg, Philippe Magarshack:
Guest Editors' Introduction: Design for Yield and Reliability. IEEE Des. Test Comput. 21(3): 177-182 (2004)

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