4. Asian Test Symposium 1995: Bangalore, India

Systems Test

Analysis Techniques

Diagnosis

Fault Simulation

Mixed-Signal Test

Design for Testability

Education and Research in Testing

Panel

Testability Measures

Delay Test I

ATPG

BIST

Self-Checking Circuits

Delay Test II

Technology-Specific Test

Design-Specific Test

maintained by Schloss Dagstuhl LZI at University of Trier