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"Test sequence compaction by reduced scan shift and retiming."

Yoshinobu Higami, Seiji Kajihara, Kozo Kinoshita (1995)

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DOI: 10.1109/ATS.1995.485333

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Yoshinobu Higami, Seiji Kajihara, Kozo Kinoshita:
Test sequence compaction by reduced scan shift and retiming. Asian Test Symposium 1995: 169-175

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