"Functional test generation for path delay faults."

Mandyam-Komar Srinivas, Vishwani D. Agrawal, Michael L. Bushnell (1995)

> Home

Details and statistics

DOI: 10.1109/ATS.1995.485358

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

- view
  authority control:
- export record
  dblp key:
  - conf/ats/SrinivasAB95
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/ats/SrinivasAB95
Mandyam-Komar Srinivas, Vishwani D. Agrawal, Michael L. Bushnell:
Functional test generation for path delay faults. Asian Test Symposium 1995: 339-345

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.