"Test configurations to enhance the testability of sequential circuits."

S. Lavabre et al. (1995)

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DOI: 10.1109/ATS.1995.485332

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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S. Lavabre, Yves Bertrand, Michel Renovell, Christian Landrault:
Test configurations to enhance the testability of sequential circuits. Asian Test Symposium 1995: 160-168

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