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Publication search results
found 60 matches
- 2014
- Yussuf Ali, Yuta Yamato, Tomokazu Yoneda, Kazumi Hatayama, Michiko Inoue:
Parallel Path Delay Fault Simulation for Multi/Many-Core Processors with SIMD Units. ATS 2014: 292-297 - Suvadeep Banerjee, Álvaro Gómez-Pau, Abhijit Chatterjee, Jacob A. Abraham:
Error Resilient Real-Time State Variable Systems for Signal Processing and Control. ATS 2014: 39-44 - Yu Bi, Pierre-Emmanuel Gaillardon, Xiaobo Sharon Hu, Michael T. Niemier, Jiann-Shiun Yuan, Yier Jin:
Leveraging Emerging Technology for Hardware Security - Case Study on Silicon Nanowire FETs and Graphene SymFETs. ATS 2014: 342-347 - Byeongju Cha, Sandeep K. Gupta:
A Resizing Method to Minimize Effects of Hardware Trojans. ATS 2014: 192-199 - Anshuman Chandra, Subramanian Chebiyam, Rohit Kapur:
A Case Study on Implementing Compressed DFT Architecture. ATS 2014: 336-341 - Harry H. Chen:
Perspectives on Test Data Mining from Industrial Experience. ATS 2014: 242-247 - Yong-Xiao Chen, Jin-Fu Li:
Testing of Non-volatile Logic-Based System Chips. ATS 2014: 224-229 - Yun Cheng, Huawei Li, Xiaowei Li:
An On-Line Timing Error Detection Method for Silicon Debug. ATS 2014: 263-268 - Da Cheng, Fangzhou Wang, Feng Gao, Sandeep K. Gupta:
Optimal Redundancy Designs for CNFET-Based Circuits. ATS 2014: 25-32 - Atefe Dalirsani, Nadereh Hatami, Michael E. Imhof, Marcus Eggenberger, Gert Schley, Martin Radetzki, Hans-Joachim Wunderlich:
On Covering Structural Defects in NoCs by Functional Tests. ATS 2014: 87-92 - Sabyasachi Deyati, Barry John Muldrey, Adit D. Singh, Abhijit Chatterjee:
High Resolution Pulse Propagation Driven Trojan Detection in Digital Logic: Optimization Algorithms and Infrastructure. ATS 2014: 200-205 - Dominik Erb, Karsten Scheibler, Matthias Sauer, Sudhakar M. Reddy, Bernd Becker:
Circuit Parameter Independent Test Pattern Generation for Interconnect Open Defects. ATS 2014: 131-136 - Junfeng Fan, Hua Xie, Yiwei Zhang:
On the Use of Scan Chain to Improve Physical Attacks (Extended Abstract). ATS 2014: 354-357 - Farshad Firouzi, Fangming Ye, Saman Kiamehr, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori:
Adaptive Mitigation of Parameter Variations. ATS 2014: 51-56 - Kelson Gent, Michael S. Hsiao:
Dual-Purpose Mixed-Level Test Generation Using Swarm Intelligence. ATS 2014: 230-235 - Emil Gizdarski:
Two-Step Dynamic Encoding for Linear Decompressors. ATS 2014: 330-335 - Taewoo Han, Inhyuk Choi, Hyunggoy Oh, Sungho Kang:
A Scalable and Parallel Test Access Strategy for NoC-Based Multicore System. ATS 2014: 81-86 - Masanori Hashimoto:
Opportunities and Verification Challenges of Run-Time Performance Adaptation. ATS 2014: 248-253 - Alison Hosey, Md. Tauhidur Rahman, Kan Xiao, Domenic Forte, Mohammad Tehranipoor:
Advanced Analysis of Cell Stability for Reliable SRAM PUFs. ATS 2014: 348-353 - Shi-Yu Huang, Hua-Xuan Li, Zeng-Fu Zeng, Kun-Han Tsai, Wu-Tung Cheng:
On-Line Transition-Time Monitoring for Die-to-Die Interconnects in 3D ICs. ATS 2014: 162-167 - Shao-Feng Hung, Long-Yi Lin, Hao-Chiao Hong:
A Cost-Effective Stimulus Generator for Battery Channel Characterization in Electric Vehicles. ATS 2014: 63-67 - Jiajia Jiao, Yuzhuo Fu:
A Heuristically Mechanical Model for Accurate and Fast Soft Error Analysis. ATS 2014: 33-38 - Artur Jutman, Matteo Sonza Reorda, Hans-Joachim Wunderlich:
High Quality System Level Test and Diagnosis. ATS 2014: 298-305 - Seiji Kajihara, Yousuke Miyake, Yasuo Sato, Yukiya Miura:
An On-Chip Digital Environment Monitor for Field Test. ATS 2014: 254-257 - Chandan Kumar, Fadi Maamari, Kiran Vittal, Wilson Pradeep, Rajesh Tiwari, Srivaths Ravi:
Methodology for Early RTL Testability and Coverage Analysis and Its Application to Industrial Designs. ATS 2014: 125-130 - Zipeng Li, Trung Anh Dinh, Tsung-Yi Ho, Krishnendu Chakrabarty:
Reliability-Driven Pipelined Scan-Like Testing of Digital Microfluidic Biochips. ATS 2014: 57-62 - Katherine Shu-Min Li, Sying-Jyan Wang, Jia-Lin Wu, Cheng-You Ho, Yingchieh Ho, Ruei-Ting Gu, Bo-Chuan Cheng:
Optimized Pre-bond Test Methodology for Silicon Interposer Testing. ATS 2014: 13-18 - Huaguo Liang, Zhi Wang, Zhengfeng Huang, Aibin Yan:
Design of a Radiation Hardened Latch for Low-Power Circuits. ATS 2014: 19-24 - Fan Lin, Chun-Kai Hsu, Kwang-Ting Cheng:
Learning from Production Test Data: Correlation Exploration and Feature Engineering. ATS 2014: 236-241 - Li Ling, Jianhui Jiang:
Exploit Dynamic Voltage and Frequency Scaling for SoC Test Scheduling under Thermal Constraints. ATS 2014: 180-185
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