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@inproceedings{DBLP:conf/ats/AliYYHI14,
author = {Yussuf Ali and
Yuta Yamato and
Tomokazu Yoneda and
Kazumi Hatayama and
Michiko Inoue},
title = {Parallel Path Delay Fault Simulation for Multi/Many-Core Processors
with {SIMD} Units},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {292--297},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.61},
doi = {10.1109/ATS.2014.61},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/AliYYHI14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/BanerjeeGCA14,
author = {Suvadeep Banerjee and
{\'{A}}lvaro G{\'{o}}mez{-}Pau and
Abhijit Chatterjee and
Jacob A. Abraham},
title = {Error Resilient Real-Time State Variable Systems for Signal Processing
and Control},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {39--44},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.19},
doi = {10.1109/ATS.2014.19},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/BanerjeeGCA14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/BiGHNYJ14,
author = {Yu Bi and
Pierre{-}Emmanuel Gaillardon and
Xiaobo Sharon Hu and
Michael T. Niemier and
Jiann{-}Shiun Yuan and
Yier Jin},
title = {Leveraging Emerging Technology for Hardware Security - Case Study
on Silicon Nanowire FETs and Graphene SymFETs},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {342--347},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.69},
doi = {10.1109/ATS.2014.69},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/BiGHNYJ14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChaG14,
author = {Byeongju Cha and
Sandeep K. Gupta},
title = {A Resizing Method to Minimize Effects of Hardware Trojans},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {192--199},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.44},
doi = {10.1109/ATS.2014.44},
timestamp = {Tue, 26 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/ChaG14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChandraCK14,
author = {Anshuman Chandra and
Subramanian Chebiyam and
Rohit Kapur},
title = {A Case Study on Implementing Compressed {DFT} Architecture},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {336--341},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.68},
doi = {10.1109/ATS.2014.68},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChandraCK14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Chen14,
author = {Harry H. Chen},
title = {Perspectives on Test Data Mining from Industrial Experience},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {242--247},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.52},
doi = {10.1109/ATS.2014.52},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Chen14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChenL14,
author = {Yong{-}Xiao Chen and
Jin{-}Fu Li},
title = {Testing of Non-volatile Logic-Based System Chips},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {224--229},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.49},
doi = {10.1109/ATS.2014.49},
timestamp = {Tue, 17 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/ChenL14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChengL014,
author = {Yun Cheng and
Huawei Li and
Xiaowei Li},
title = {An On-Line Timing Error Detection Method for Silicon Debug},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {263--268},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.63},
doi = {10.1109/ATS.2014.63},
timestamp = {Thu, 11 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/ChengL014.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChengWGG14,
author = {Da Cheng and
Fangzhou Wang and
Feng Gao and
Sandeep K. Gupta},
title = {Optimal Redundancy Designs for CNFET-Based Circuits},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {25--32},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.17},
doi = {10.1109/ATS.2014.17},
timestamp = {Fri, 22 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/ChengWGG14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/DalirsaniHIESRW14,
author = {Atefe Dalirsani and
Nadereh Hatami and
Michael E. Imhof and
Marcus Eggenberger and
Gert Schley and
Martin Radetzki and
Hans{-}Joachim Wunderlich},
title = {On Covering Structural Defects in NoCs by Functional Tests},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {87--92},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.27},
doi = {10.1109/ATS.2014.27},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/DalirsaniHIESRW14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/DeyatiMSC14,
author = {Sabyasachi Deyati and
Barry John Muldrey and
Adit D. Singh and
Abhijit Chatterjee},
title = {High Resolution Pulse Propagation Driven Trojan Detection in Digital
Logic: Optimization Algorithms and Infrastructure},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {200--205},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.45},
doi = {10.1109/ATS.2014.45},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/DeyatiMSC14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ErbSSRB14,
author = {Dominik Erb and
Karsten Scheibler and
Matthias Sauer and
Sudhakar M. Reddy and
Bernd Becker},
title = {Circuit Parameter Independent Test Pattern Generation for Interconnect
Open Defects},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {131--136},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.34},
doi = {10.1109/ATS.2014.34},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ErbSSRB14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/FanXZ14,
author = {Junfeng Fan and
Hua Xie and
Yiwei Zhang},
title = {On the Use of Scan Chain to Improve Physical Attacks (Extended Abstract)},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {354--357},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.71},
doi = {10.1109/ATS.2014.71},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/FanXZ14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/FirouziYKCT14,
author = {Farshad Firouzi and
Fangming Ye and
Saman Kiamehr and
Krishnendu Chakrabarty and
Mehdi Baradaran Tahoori},
title = {Adaptive Mitigation of Parameter Variations},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {51--56},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.21},
doi = {10.1109/ATS.2014.21},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/FirouziYKCT14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/GentH14,
author = {Kelson Gent and
Michael S. Hsiao},
title = {Dual-Purpose Mixed-Level Test Generation Using Swarm Intelligence},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {230--235},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.50},
doi = {10.1109/ATS.2014.50},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/GentH14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Gizdarski14,
author = {Emil Gizdarski},
title = {Two-Step Dynamic Encoding for Linear Decompressors},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {330--335},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.67},
doi = {10.1109/ATS.2014.67},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Gizdarski14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HanCOK14,
author = {Taewoo Han and
Inhyuk Choi and
Hyunggoy Oh and
Sungho Kang},
title = {A Scalable and Parallel Test Access Strategy for NoC-Based Multicore
System},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {81--86},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.26},
doi = {10.1109/ATS.2014.26},
timestamp = {Tue, 27 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HanCOK14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Hashimoto14,
author = {Masanori Hashimoto},
title = {Opportunities and Verification Challenges of Run-Time Performance
Adaptation},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {248--253},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.53},
doi = {10.1109/ATS.2014.53},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Hashimoto14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HoseyRXFT14,
author = {Alison Hosey and
Md. Tauhidur Rahman and
Kan Xiao and
Domenic Forte and
Mohammad Tehranipoor},
title = {Advanced Analysis of Cell Stability for Reliable {SRAM} PUFs},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {348--353},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.70},
doi = {10.1109/ATS.2014.70},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HoseyRXFT14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HuangLZTC14,
author = {Shi{-}Yu Huang and
Hua{-}Xuan Li and
Zeng{-}Fu Zeng and
Kun{-}Han Tsai and
Wu{-}Tung Cheng},
title = {On-Line Transition-Time Monitoring for Die-to-Die Interconnects in
3D ICs},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {162--167},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.39},
doi = {10.1109/ATS.2014.39},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HuangLZTC14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HungLH14,
author = {Shao{-}Feng Hung and
Long{-}Yi Lin and
Hao{-}Chiao Hong},
title = {A Cost-Effective Stimulus Generator for Battery Channel Characterization
in Electric Vehicles},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {63--67},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.23},
doi = {10.1109/ATS.2014.23},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HungLH14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/JiaoF14,
author = {Jiajia Jiao and
Yuzhuo Fu},
title = {A Heuristically Mechanical Model for Accurate and Fast Soft Error
Analysis},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {33--38},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.18},
doi = {10.1109/ATS.2014.18},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/JiaoF14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/JutmanRW14,
author = {Artur Jutman and
Matteo Sonza Reorda and
Hans{-}Joachim Wunderlich},
title = {High Quality System Level Test and Diagnosis},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {298--305},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.62},
doi = {10.1109/ATS.2014.62},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/JutmanRW14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KajiharaMSM14,
author = {Seiji Kajihara and
Yousuke Miyake and
Yasuo Sato and
Yukiya Miura},
title = {An On-Chip Digital Environment Monitor for Field Test},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {254--257},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.54},
doi = {10.1109/ATS.2014.54},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KajiharaMSM14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KumarMVPTR14,
author = {Chandan Kumar and
Fadi Maamari and
Kiran Vittal and
Wilson Pradeep and
Rajesh Tiwari and
Srivaths Ravi},
title = {Methodology for Early {RTL} Testability and Coverage Analysis and
Its Application to Industrial Designs},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {125--130},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.33},
doi = {10.1109/ATS.2014.33},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KumarMVPTR14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LiDHC14,
author = {Zipeng Li and
Trung Anh Dinh and
Tsung{-}Yi Ho and
Krishnendu Chakrabarty},
title = {Reliability-Driven Pipelined Scan-Like Testing of Digital Microfluidic
Biochips},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {57--62},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.22},
doi = {10.1109/ATS.2014.22},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LiDHC14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LiWWHHGC14,
author = {Katherine Shu{-}Min Li and
Sying{-}Jyan Wang and
Jia{-}Lin Wu and
Cheng{-}You Ho and
Yingchieh Ho and
Ruei{-}Ting Gu and
Bo{-}Chuan Cheng},
title = {Optimized Pre-bond Test Methodology for Silicon Interposer Testing},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {13--18},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.15},
doi = {10.1109/ATS.2014.15},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LiWWHHGC14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LiangWHY14,
author = {Huaguo Liang and
Zhi Wang and
Zhengfeng Huang and
Aibin Yan},
title = {Design of a Radiation Hardened Latch for Low-Power Circuits},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {19--24},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.16},
doi = {10.1109/ATS.2014.16},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LiangWHY14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LinHC14,
author = {Fan Lin and
Chun{-}Kai Hsu and
Kwang{-}Ting Cheng},
title = {Learning from Production Test Data: Correlation Exploration and Feature
Engineering},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {236--241},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.51},
doi = {10.1109/ATS.2014.51},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LinHC14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LingJ14,
author = {Li Ling and
Jianhui Jiang},
title = {Exploit Dynamic Voltage and Frequency Scaling for SoC Test Scheduling
under Thermal Constraints},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {180--185},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.36},
doi = {10.1109/ATS.2014.36},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LingJ14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LuJLHK14,
author = {Shyue{-}Kung Lu and
Hao{-}Cheng Jheng and
Hao{-}Wei Lin and
Masaki Hashizume and
Seiji Kajihara},
title = {Built-In Scrambling Analysis for Yield Enhancement of Embedded Memories},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {137--142},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.41},
doi = {10.1109/ATS.2014.41},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LuJLHK14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MilewskiMRT14,
author = {Sylwester Milewski and
Grzegorz Mrugalski and
Janusz Rajski and
Jerzy Tyszer},
title = {Low Power Test Compression with Programmable Broadcast-Based Control},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {174--179},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.35},
doi = {10.1109/ATS.2014.35},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MilewskiMRT14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MitsuyamaO14,
author = {Yukio Mitsuyama and
Hidetoshi Onodera},
title = {Variability and Soft-Error Resilience in Dependable {VLSI} Platform},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {45--50},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.20},
doi = {10.1109/ATS.2014.20},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MitsuyamaO14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MiyakeSKM14,
author = {Yousuke Miyake and
Yasuo Sato and
Seiji Kajihara and
Yukiya Miura},
title = {Temperature and Voltage Estimation Using Ring-Oscillator-Based Monitor
for Field Test},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {156--161},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.38},
doi = {10.1109/ATS.2014.38},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MiyakeSKM14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MondalKDR14,
author = {Bappaditya Mondal and
Dipak Kumar Kole and
Debesh Kumar Das and
Hafizur Rahaman},
title = {Generator for Test Set Construction of {SMGF} in Reversible Circuit
by Boolean Difference Method},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {68--73},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.24},
doi = {10.1109/ATS.2014.24},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MondalKDR14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MoreiraWIRFY14,
author = {Jose Moreira and
Hubert Werkmann and
Masahiro Ishida and
Bernhard Roth and
Volker Filsinger and
Sui{-}Xia Yang},
title = {An {ATE} Based 32 Gbaud {PAM-4} At-Speed Characterization and Testing
Solution},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {218--223},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.48},
doi = {10.1109/ATS.2014.48},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MoreiraWIRFY14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/NagataFM14,
author = {Makoto Nagata and
Daisuke Fujimoto and
Noriyuki Miura},
title = {On-Chip Monitoring for In-Place Diagnosis of Undesired Power Domain
Problems in {IC} Chips},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {258--262},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.55},
doi = {10.1109/ATS.2014.55},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/NagataFM14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/PorcheB14,
author = {John A. Porche and
R. D. (Shawn) Blanton},
title = {Physically-Aware Diagnostic Resolution},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {206--211},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.46},
doi = {10.1109/ATS.2014.46},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/PorcheB14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/QiuY014,
author = {Jibing Qiu and
Guihai Yan and
Xiaowei Li},
title = {On-Chip Delay Sensor for Environments with Large Temperature Fluctuations},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {275--280},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.65},
doi = {10.1109/ATS.2014.65},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/QiuY014.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/RenaudBMS14,
author = {Guillaume Renaud and
Manuel J. Barrag{\'{a}}n and
Salvador Mir and
Marc Sabut},
title = {On-Chip Implementation of an Integrator-Based Servo-Loop for {ADC}
Static Linearity Test},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {212--217},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.47},
doi = {10.1109/ATS.2014.47},
timestamp = {Wed, 28 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/RenaudBMS14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SadiCEKBT14,
author = {Mehdi Sadi and
Zoe Conroy and
Bill Eklow and
Matthias Kamm and
Nematollah Bidokhti and
Mark Mohammad Tehranipoor},
title = {An All Digital Distributed Sensor Network Based Framework for Continuous
Noise Monitoring and Timing Failure Analysis in SoCs},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {269--274},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.64},
doi = {10.1109/ATS.2014.64},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/SadiCEKBT14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ShenXJ14,
author = {Kele Shen and
Dong Xiang and
Zhou Jiang},
title = {Dual-Speed {TAM} Optimization of 3D SoCs for Mid-bond and Post-bond
Testing},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {7--12},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.14},
doi = {10.1109/ATS.2014.14},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ShenXJ14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ShiN14,
author = {Xiaobing Shi and
Nicola Nicolici},
title = {On Supporting Sequential Constraints for On-Chip Generation of Post-silicon
Validation Stimuli},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {107--112},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.30},
doi = {10.1109/ATS.2014.30},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ShiN14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SunBDGVA14,
author = {Zhenzhou Sun and
Alberto Bosio and
Luigi Dilillo and
Patrick Girard and
Arnaud Virazel and
Etienne Auvray},
title = {On the Generation of Diagnostic Test Set for Intra-cell Defects},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {312--317},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.57},
doi = {10.1109/ATS.2014.57},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/SunBDGVA14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TangBRCHHTCS14,
author = {Huaxing Tang and
Brady Benware and
Michael Reese and
Joseph Caroselli and
Thomas Herrmann and
Friedrich Hapke and
Robert Tao and
Wu{-}Tung Cheng and
Manish Sharma},
title = {Diagnosing Cell Internal Defects Using Analog Simulation-Based Fault
Models},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {318--323},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.58},
doi = {10.1109/ATS.2014.58},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/TangBRCHHTCS14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TenentesKAZY14,
author = {Vasileios Tenentes and
S. Saqib Khursheed and
Bashir M. Al{-}Hashimi and
Shida Zhong and
Sheng Yang},
title = {High Quality Testing of Grid Style Power Gating},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {186--191},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.37},
doi = {10.1109/ATS.2014.37},
timestamp = {Mon, 15 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/TenentesKAZY14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TrawkaMMPRJT14,
author = {Maciej Trawka and
Grzegorz Mrugalski and
Nilanjan Mukherjee and
Artur Pogiel and
Janusz Rajski and
Jakub Janicki and
Jerzy Tyszer},
title = {High-Speed Serial Embedded Deterministic Test for System-on-Chip Designs},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {74--80},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.25},
doi = {10.1109/ATS.2014.25},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/TrawkaMMPRJT14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Tsai14,
author = {Kun{-}Han Tsai},
title = {Testability-Driven Fault Sampling for Deterministic Test Coverage
Estimation of Large Designs},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {119--124},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.32},
doi = {10.1109/ATS.2014.32},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Tsai14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/WangCHH14,
author = {Chung{-}Yun Wang and
Yu{-}Yi Chen and
Jiun{-}Lang Huang and
Xuan{-}Lun Huang},
title = {FPGA-Based Subset Sum Delay Lines},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {287--291},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.60},
doi = {10.1109/ATS.2014.60},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/WangCHH14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/WangKL14,
author = {Sying{-}Jyan Wang and
Che{-}Wei Kao and
Katherine Shu{-}Min Li},
title = {Improving Output Compaction Efficiency with High Observability Scan
Chains},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {324--329},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.66},
doi = {10.1109/ATS.2014.66},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/WangKL14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/WuL14,
author = {Cheng{-}Hung Wu and
Kuen{-}Jong Lee},
title = {An Efficient Diagnosis Pattern Generation Procedure to Distinguish
Stuck-at Faults and Bridging Faults},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {306--311},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.56},
doi = {10.1109/ATS.2014.56},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/WuL14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/WuLYHYKCL14,
author = {Kuan{-}Te Wu and
Jin{-}Fu Li and
Yun{-}Chao Yu and
Chih{-}Sheng Hou and
Chi{-}Chun Yang and
Ding{-}Ming Kwai and
Yung{-}Fa Chou and
Chih{-}Yen Lo},
title = {Intra-channel Reconfigurable Interface for {TSV} and Micro Bump Fault
Tolerance in 3-D RAMs},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {143--148},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.42},
doi = {10.1109/ATS.2014.42},
timestamp = {Tue, 17 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/WuLYHYKCL14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/XueB14,
author = {Cheng Xue and
R. D. (Shawn) Blanton},
title = {Predicting {IC} Defect Level Using Diagnosis},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {113--118},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.31},
doi = {10.1109/ATS.2014.31},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/XueB14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YamaguchiTKA14,
author = {Takahiro J. Yamaguchi and
James S. Tandon and
Satoshi Komatsu and
Kunihiro Asada},
title = {A Novel Circuit for Transition-Edge Detection: Using a Stochastic
Comparator Group to Test Transition-Edge},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {168--173},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.40},
doi = {10.1109/ATS.2014.40},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YamaguchiTKA14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YangCGWN14,
author = {Fan Yang and
Sreejit Chakravarty and
Arun Gunda and
Nicole Wu and
Jianyu Ning},
title = {Silicon Evaluation of Cell-Aware {ATPG} Tests and Small Delay Tests},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {101--106},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.29},
doi = {10.1109/ATS.2014.29},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YangCGWN14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YouYLLCLKCW14,
author = {Yun{-}Chao You and
Chi{-}Chun Yang and
Jin{-}Fu Li and
Chih{-}Yen Lo and
Chao{-}Hsun Chen and
Jenn{-}Shiang Lai and
Ding{-}Ming Kwai and
Yung{-}Fa Chou and
Cheng{-}Wen Wu},
title = {BIST-Assisted Tuning Scheme for Minimizing IO-Channel Power of TSV-Based
3D DRAMs},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.13},
doi = {10.1109/ATS.2014.13},
timestamp = {Tue, 17 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/YouYLLCLKCW14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZadeganLJDK14,
author = {Farrokh Ghani Zadegan and
Erik Larsson and
Artur Jutman and
Sergei Devadze and
Rene Krenz{-}Baath},
title = {Design, Verification, and Application of {IEEE} 1687},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {93--100},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.28},
doi = {10.1109/ATS.2014.28},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ZadeganLJDK14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZhangG14,
author = {Jizhe Zhang and
Sandeep Gupta},
title = {{SRAM} Array Yield Estimation under Spatially-Correlated Process Variation},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {149--155},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.43},
doi = {10.1109/ATS.2014.43},
timestamp = {Tue, 26 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/ZhangG14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZouHS14,
author = {Jie Zou and
Chao Han and
Adit D. Singh},
title = {Timing Evaluation Tests for Scan Enable Signals with Application to
{TDF} Testing},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {281--286},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.59},
doi = {10.1109/ATS.2014.59},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ZouHS14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ats/2014,
title = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://ieeexplore.ieee.org/xpl/conhome/6975725/proceeding},
isbn = {978-1-4799-6030-9},
timestamp = {Wed, 16 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/2014.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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