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2010 – 2019
- 2016
[b1]Chun-Kai Hsu:
Test Data Analytics: Exploration of Hidden Patterns for Test Cost Reduction and Silicon Characterization. University of California, Santa Barbara, USA, 2016- [c9]Chun-Kai Hsu, Peter Sarson, Gregor Schatzberger, Friedrich Peter Leisenberger, John M. Carulli Jr., Siddhartha Siddhartha, Kwang-Ting Cheng
:
Variation and failure characterization through pattern classification of test data from multiple test stages. ITC 2016: 1-10 - 2015
- [c8]Fan Lin, Chun-Kai Hsu, Alberto Giovanni Busetto, Kwang-Ting Cheng:
Pairwise Proximity-Based Features for Test Escape Screening. ICCAD 2015: 300-306 - [c7]Fan Lin, Chun-Kai Hsu, Kwang-Ting Cheng:
AdaTest: An efficient statistical test framework for test escape screening. ITC 2015: 1-8 - 2014
- [c6]Fan Lin, Chun-Kai Hsu, Kwang-Ting Cheng:
Learning from Production Test Data: Correlation Exploration and Feature Engineering. ATS 2014: 236-241 - [c5]Shuangyue Zhang, Fan Lin, Chun-Kai Hsu, Kwang-Ting Cheng, Hong Wang:
Joint Virtual Probe: Joint exploration of multiple test items' spatial patterns for efficient silicon characterization and test prediction. DATE 2014: 1-6 - [c4]Fan Lin, Chun-Kai Hsu, Kwang-Ting Cheng:
Feature engineering with canonical analysis for effective statistical tests screening test escapes. ITC 2014: 1-10 - 2013
- [c3]Shin-Shiun Chen, Chun-Kai Hsu, Hsiu-Chuan Shih, Jen-Chieh Yeh, Cheng-Wen Wu:
Processor and DRAM integration by TSV-based 3-D stacking for power-aware SOCs. ASP-DAC 2013: 429-434 - [c2]Chun-Kai Hsu, Fan Lin, Kwang-Ting Cheng, Wangyang Zhang, Xin Li, John M. Carulli, Kenneth M. Butler:
Test data analytics - Exploring spatial and test-item correlations in production test data. ITC 2013: 1-10
2000 – 2009
- 2008
- [c1]Chun-Kai Hsu, Li-Ming Denq, Mao-Yin Wang, Jing-Jia Liou, Chih-Tsun Huang, Cheng-Wen Wu:
Area and Test Cost Reduction for On-Chip Wireless Test Channels with System-Level Design Techniques. ATS 2008: 245-250
Coauthor Index
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