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Publication search results
found 87 matches
- 2006
- Jais Abraham, Uday Goel, Arun Kumar:
Multi-Cycle Sensitizable Transition Delay Faults. VTS 2006: 306-313 - Vishwani D. Agrawal, Soumitra Bose, Vijay Gangaram:
Upper Bounding Fault Coverage by Structural Analysis and Signal Monitoring. VTS 2006: 88-93 - Davide Appello:
Session Abstract. VTS 2006: 240-241 - Davide Appello, Vincenzo Tancorre, Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda:
On the Automation of the Test Flow of Complex SoCs. VTS 2006: 166-171 - Maryam Ashouei, Soumendu Bhattacharya, Abhijit Chatterjee:
Design of Soft Error Resilient Linear Digital Filters Using Checksum-Based Probabilistic Error Correction. VTS 2006: 208-213 - Tiago R. Balen, José Vicente Calvano, Marcelo Lubaszewski, Michel Renovell:
Functional Test of Field Programmable Analog Arrays. VTS 2006: 326-333 - Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda:
A Pattern Ordering Algorithm for Reducing the Size of Fault Dictionaries. VTS 2006: 386-391 - Sebastià A. Bota, M. Rosales, José Luis Rosselló, Jaume Segura:
Low V_D_D vs. Delay: Is it Really a Good Correlation Metric for Nanometer ICs?. VTS 2006: 358-363 - Jason G. Brown, R. D. (Shawn) Blanton:
Exploiting Regularity for Inductive Fault Analysis. VTS 2006: 364-369 - R. Chandramouli:
Session Abstract. VTS 2006: 420-421 - Mingjing Chen, Hosam Haggag, Alex Orailoglu:
Decision Tree Based Mismatch Diagnosis in Analog Circuits. VTS 2006: 278-285 - Erik Chmelar, Edward J. McCluskey:
Session Abstract. VTS 2006: 156-157 - Minsik Cho, David Z. Pan:
PEAKASO: Peak-Temperature Aware Scan-Vector Optimization. VTS 2006: 52-57 - Kun Young Chung, Sandeep K. Gupta:
Low-Cost Scan-Based Delay Testing of Latch-Based Circuits with Time Borrowing. VTS 2006: 8-15 - Bernard Courtois:
Session Abstract. VTS 2006: 150-151 - Ramyanshu Datta, Gary D. Carpenter, Kevin J. Nowka, Jacob A. Abraham:
A Scheme for On-Chip Timing Characterization. VTS 2006: 24-29 - Sai Raghuram Durbha, Amit Laknaur, Haibo Wang:
Investigating the Efficiency of Integrator-Based Capacitor Array Testing Techniques. VTS 2006: 320-325 - Avijit Dutta, Nur A. Touba:
Iterative OPDD Based Signal Probability Calculation. VTS 2006: 72-77 - Xinyue Fan, Will R. Moore, Camelia Hora, Mario Konijnenburg, Guido Gronthoud:
A Gate-Level Method for Transistor-Level Bridging Fault Diagnosis. VTS 2006: 266-271 - Rajesh Galivanche, Bob Gottlieb:
Session Abstract. VTS 2006: 422-423 - Olivier Ginez, Jean Michel Daga, Marylene Combe, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel:
An Overview of Failure Mechanisms in Embedded Flash Memories. VTS 2006: 108-113 - Cristian Grecu, Partha Pratim Pande, André Ivanov, Res Saleh:
BIST for Network-on-Chip Interconnect Infrastructures. VTS 2006: 30-35 - Giuseppe Di Guglielmo, Franco Fummi, Cristina Marconcini, Graziano Pravadelli:
Improving Gate-Level ATPG by Traversing Concurrent EFSMs. VTS 2006: 172-179 - Ruifeng Guo, Subhasish Mitra, M. Enamul Amyeen, Jinkyu Lee, Srihari Sivaraj, Srikanth Venkataraman:
Evaluation of Test Metrics: Stuck-at, Bridge Coverage Estimate and Gate Exhaustive. VTS 2006: 66-71 - Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian:
Minimal March Test Algorithm for Detection of Linked Static Faults in Random Access Memories. VTS 2006: 120-127 - Kazumi Hatayama:
Session Abstract. VTS 2006: 200-201 - Yu-Ying Hsiao, Chao-Hsun Chen, Cheng-Wen Wu:
A Built-In Self-Repair Scheme for NOR-Type Flash Memory. VTS 2006: 114-119 - Hsieh-Hung Hsieh, Liang-Hung Lu:
Integrated CMOS Power Sensors for RF BIST Applications. VTS 2006: 234-239 - Tong-Yu Hsieh, Kuen-Jong Lee, Melvin A. Breuer:
An Error-Oriented Test Methodology to Improve Yield with Error-Tolerance. VTS 2006: 130-135 - André Ivanov:
Session Abstract. VTS 2006: 424-425
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