"Investigating the Efficiency of Integrator-Based Capacitor Array Testing ..."

Sai Raghuram Durbha, Amit Laknaur, Haibo Wang (2006)

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DOI: 10.1109/VTS.2006.42

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Sai Raghuram Durbha, Amit Laknaur, Haibo Wang:
Investigating the Efficiency of Integrator-Based Capacitor Array Testing Techniques. VTS 2006: 320-325

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