- Ajay Khoche:
Session Abstract. VTS 2006: 152-153 - Ajay Khoche, Peter Muhmenthaler:
Session Abstract. VTS 2006: 288-289 - Ajay Khoche, Mike Rodgers, Pete O'Neil:
Session Abstract. VTS 2006: 426 - Kee Sup Kim, Mohammad Tehranipoor:
Session Abstract. VTS 2006: 292-293 - C.-Y. Kuo, J.-L. Huang:
A Period Tracking Based On-Chip Sinusoidal Jitter Extraction Technique. VTS 2006: 400-405 - Hangkyu Lee, Irith Pomeranz, Sudhakar M. Reddy:
A Test Generation Procedure for Avoiding the Detection of Functionally Redundant Transition Faults. VTS 2006: 294-299 - Jinkyu Lee, Nur A. Touba:
Combining Linear and Non-Linear Test Vector Compression Using Correlation-Based Rectangular Encoding. VTS 2006: 252-257 - Jeremy Lee, Mohammad Tehranipoor, Jim Plusquellic:
A Low-Cost Solution for Protecting IPs Against Scan-Based Side-Channel Attacks. VTS 2006: 94-99 - Huawei Li, Pei-Fu Shen, Xiaowei Li:
Robust Test Generation for Precise Crosstalk-induced Path Delay Faults. VTS 2006: 300-305 - Xijiang Lin, Janusz Rajski:
The Impacts of Untestable Defects on Transition Fault Testing. VTS 2006: 2-7 - Chunsheng Liu, Vikram Iyengar, Dhiraj K. Pradhan:
Thermal-Aware Testing of Network-on-Chip Using Multiple-Frequency Clocking. VTS 2006: 46-51 - Fang Liu, Plamen K. Nikolov, Sule Ozev:
Parametric Fault Diagnosis for Analog Circuits Using a Bayesian Framework. VTS 2006: 272-277 - Yoshiyuki Nakamura, Jacob Savir, Hideo Fujiwara:
BIST Pretest of ICs: Risks and Benefits. VTS 2006: 142-149 - Vishwanath Natarajan, Soumendu Bhattacharya, Abhijit Chatterjee:
Alternate Electrical Tests for Extracting Mechanical Parameters of MEMS Accelerometer Sensors. VTS 2006: 192-199 - Suriyaprakash Natarajan, Srinivas Patil, Sreejit Chakravarty:
Path Delay Fault Simulation on Large Industrial Designs. VTS 2006: 16-23 - Michael Nicolaidis:
Session Abstract. VTS 2006: 286-287 - Phil Nigh:
Session Abstract. VTS 2006: 44 - Rubin A. Parekhji:
Session Abstract. VTS 2006: 86-87 - Praveen Parvathala:
Session Abstract. VTS 2006: 158-159 - Richard Putman, Rahul Gawde:
Enhanced Timing-Based Transition Delay Testing for Small Delay Defects. VTS 2006: 336-342 - Reza M. Rad, Mohammad Tehranipoor:
SCT: An Approach For Testing and Configuring Nanoscale Devices. VTS 2006: 370-377 - Wojciech Rajski, Janusz Rajski:
Modular Compactor of Test Responses. VTS 2006: 242-251 - Wenjing Rao, Alex Orailoglu, Ramesh Karri:
Nanofabric Topologies and Reconfiguration Algorithms to Support Dynamically Adaptive Fault Tolerance. VTS 2006: 214-221 - Luís Rolíndez, Salvador Mir, Ahcène Bounceur, Jean-Louis Carbonéro:
A SNDR BIST for Sigma-Delta Analogue-to-Digital Converters. VTS 2006: 314-319 - Bharath Seshadri, Irith Pomeranz, Srikanth Venkataraman, M. Enamul Amyeen, Sudhakar M. Reddy:
Dominance Based Analysis for Large Volume Production Fail Diagnosis. VTS 2006: 392-399 - Bharath Seshadri, Xiaoming Yu, Srikanth Venkataraman:
Accelerating Diagnostic Fault Simulation Using Z-diagnosis and Concurrent Equivalence Identification. VTS 2006: 380-385 - Ashutosh Sharma, Anura P. Jayasumana, Yashwant K. Malaiya:
X-IDDQ: A Novel Defect Detection Technique Using IDDQ Data. VTS 2006: 180-185 - Hongjoong Shin, Byoungho Kim, Jacob A. Abraham:
Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits. VTS 2006: 412-419 - Adit D. Singh, Gefu Xu:
Output Hazard-Free Transition Tests for Silicon Calibrated Scan Based Delay Testing. VTS 2006: 349-357 - Ganesh Srinivasan, Abhijit Chatterjee, Friedrich Taenzler:
Alternate Loop-Back Diagnostic Tests for Wafer-Level Diagnosis of Modern Wireless Transceivers using Spectral Signatures. VTS 2006: 222-227