"Robust Test Generation for Precise Crosstalk-induced Path Delay Faults."

Huawei Li, Pei-Fu Shen, Xiaowei Li (2006)

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DOI: 10.1109/VTS.2006.60

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-11

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Huawei Li, Pei-Fu Shen, Xiaowei Li:
Robust Test Generation for Precise Crosstalk-induced Path Delay Faults. VTS 2006: 300-305

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