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ORCIDVishwanath Natarajan
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2010 – 2019
- 2017
[j7]Jae Woong Jeong, Vishwanath Natarajan, Shreyas Sen, T. M. Mak, Jennifer Kitchen, Sule Ozev:
A Comprehensive BIST Solution for Polar Transceivers Using On-Chip Resources. ACM Trans. Design Autom. Electr. Syst. 23(1): 2:1-2:21 (2017)- 2015
- [j6]Vishwanath Natarajan, Aritra Banerjee
, Shreyas Sen, Shyam Kumar Devarakond, Abhijit Chatterjee:
Yield Recovery of RF Transceiver Systems Using Iterative Tuning-Driven Power-Conscious Performance Optimization. IEEE Des. Test 32(1): 61-69 (2015) - 2014
- [j5]Shreyas Sen, Vishwanath Natarajan, Shyam Kumar Devarakond, Abhijit Chatterjee:
Process-Variation Tolerant Channel-Adaptive Virtually Zero-Margin Low-Power Wireless Receiver Systems. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 33(12): 1764-1777 (2014) - [c18]Jae Woong Jeong, Sule Ozev, Shreyas Sen, Vishwanath Natarajan, Mustapha Slamani:
Built-in self-test and characterization of polar transmitter parameters in the loop-back mode. DATE 2014: 1-6 - 2012
- [j4]Shreyas Sen, Aritra Banerjee, Vishwanath Natarajan, Shyam Kumar Devarakond, Hyun Woo Choi, Abhijit Chatterjee:
BIST/Digital-Compatible Testing of RF Devices Using Distortion Model Fitting. J. Electron. Test. 28(4): 405-419 (2012) - [j3]Vishwanath Natarajan, Hyun Woo Choi, Aritra Banerjee, Shreyas Sen, Abhijit Chatterjee, Ganesh Srinivasan, Friedrich Taenzler, Soumendu Bhattacharya:
Low Cost EVM Testing of Wireless RF SoC Front-Ends Using Multitones. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31(7): 1088-1101 (2012) - 2011
- [c17]Aritra Banerjee, Vishwanath Natarajan, Shreyas Sen, Abhijit Chatterjee, Ganesh Srinivasan, Soumendu Bhattacharya:
Optimized Multitone Test Stimulus Driven Diagnosis of RF Transceivers Using Model Parameter Estimation. VLSI Design 2011: 274-279 - [p1]Shreyas Sen, Vishwanath Natarajan, Abhijit Chatterjee:
Low-Power Adaptive Mixed Signal/RF Circuits and Systems and Self-Healing Solutions. Low-Power Variation-Tolerant Design in Nanometer Silicon 2011: 293-333 - 2010
- [j2]Vishwanath Natarajan, Shreyas Sen, Aritra Banerjee, Abhijit Chatterjee, Ganesh Srinivasan, Friedrich Taenzler:
Analog Signature- Driven Postmanufacture Multidimensional Tuning of RF Systems. IEEE Des. Test Comput. 27(6): 6-17 (2010) - [c16]Shyam Kumar Devarakond, Shreyas Sen, Vishwanath Natarajan, Aritra Banerjee, Hyun Woo Choi, Ganesh Srinivasan, Abhijit Chatterjee:
Digitally Assisted Concurrent Built-In Tuning of RF Systems Using Hamming Distance Proportional Signatures. Asian Test Symposium 2010: 283-288 - [c15]Shyam Kumar Devarakond, Shreyas Sen, Aritra Banerjee, Vishwanath Natarajan, Abhijit Chatterjee:
Built-in performance monitoring of mixed-signal/RF front ends using real-time parameter estimation. IOLTS 2010: 77-82 - [c14]Vishwanath Natarajan, Shreyas Sen, Shyam Kumar Devarakond, Abhijit Chatterjee:
A holistic approach to accurate tuning of RF systems for large and small multiparameter perturbations. VTS 2010: 331-336
2000 – 2009
- 2009
- [c13]Sehun Kook, Hyun Woo Choi, Vishwanath Natarajan, Abhijit Chatterjee, Alfred V. Gomes, Shalabh Goyal, Le Jin:
Low Cost Dynamic Test Methodology for High Precision ΣD ADCs. Asian Test Symposium 2009: 69-74 - [c12]Vishwanath Natarajan, Shyam Kumar Devarakond, Shreyas Sen, Abhijit Chatterjee:
BIST Driven Power Conscious Post-Manufacture Tuning of Wireless Transceiver Systems Using Hardware-Iterated Gradient Search. Asian Test Symposium 2009: 243-248 - [c11]Sehun Kook, Vishwanath Natarajan, Abhijit Chatterjee, Shalabh Goyal, Le Jin:
Testing of High Resolution ADCs Using Lower Resolution DACs via Iterative Transfer Function Estimation. ETS 2009: 3-8 - [c10]Abhijit Chatterjee, Donghoon Han, Vishwanath Natarajan, Shyam Kumar Devarakond, Shreyas Sen, Hyun Woo Choi, Rajarajan Senguttuvan, Soumendu Bhattacharya, Abhilash Goyal, Deuk Lee, Madhavan Swaminathan:
Iterative built-in testing and tuning of mixed-signal/RF systems. ICCD 2009: 319-326 - 2008
- [j1]Vishwanath Natarajan, Rajarajan Senguttuvan, Shreyas Sen, Abhijit Chatterjee:
Built-in Test Enabled Diagnosis and Tuning of RF Transmitter Systems. VLSI Design 2008: 418165:1-418165:10 (2008) - [c9]Deuk Lee, Vishwanath Natarajan, Rajarajan Senguttuvan, Abhijit Chatterjee:
Efficient Low-Cost Testing of Wireless OFDM Polar Transceiver Systems. ATS 2008: 55-60 - [c8]Shreyas Sen, Vishwanath Natarajan, Rajarajan Senguttuvan, Abhijit Chatterjee:
Pro-VIZOR: process tunable virtually zero margin low power adaptive RF for wireless systems. DAC 2008: 492-497 - [c7]Vishwanath Natarajan, Hyun Woo Choi, Deuk Lee, Rajarajan Senguttuvan, Abhijit Chatterjee:
EVM Testing of Wireless OFDM Transceivers Using Intelligent Back-End Digital Signal Processing Algorithms. ITC 2008: 1-10 - [c6]Vishwanath Natarajan, Rajarajan Senguttuvan, Shreyas Sen, Abhijit Chatterjee:
ACT: Adaptive Calibration Test for Performance Enhancement and Increased Testability of Wireless RF Front-Ends. VTS 2008: 215-220 - 2007
- [c5]Ganesh Srinivasan, Abhijit Chatterjee, Vishwanath Natarajan:
Fourier Spectrum-Based Signature Test: A Genetic CAD Toolbox for Reliable RF Testing Using Low-Performance Test Resources. ATS 2007: 139-142 - [c4]Vishwanath Natarajan, Ganesh Srinivasan, Abhijit Chatterjee, Craig Force:
Novel Cross-Loopback Based Test Approach for Specification Test of Multi-Band, Multi-Hardware Radios. VTS 2007: 297-302 - 2006
- [c3]Vishwanath Natarajan, Ganesh Srinivasan, Abhijit Chatterjee:
On-Line Error Detection in Wireless RF Transmitters Using Real-time Streaming Data. IOLTS 2006: 159-164 - [c2]Soumendu Bhattacharya, Vishwanath Natarajan, Abhijit Chatterjee, Sankar Nair:
Efficient DNA Sensing with Fabricated Silicon Nanopores: Diagnosis Methodology and Algorithms. VLSI Design 2006: 729-733 - [c1]Vishwanath Natarajan, Soumendu Bhattacharya, Abhijit Chatterjee:
Alternate Electrical Tests for Extracting Mechanical Parameters of MEMS Accelerometer Sensors. VTS 2006: 192-199
Coauthor Index
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