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ORCIDStephan Eggersglüß
Person information
- affiliation: Siemens Digital Industries Software, Wilsonville, OR, USA
- affiliation (former): DFKI, Bremen
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Books and Theses
- 2012
[b3]Stephan Eggersglüß, Rolf Drechsler
:
High Quality Test Pattern Generation and Boolean Satisfiability. Springer 2012, ISBN 978-1-4419-9975-7, pp. I-XVIII, 1-193- 2010
- [b2]Stephan Eggersglüß:
Robust algorithms for high quality test pattern generation using Boolean satisfiability. University of Bremen, 2010, pp. 1-182 - 2009
- [b1]Rolf Drechsler, Stephan Eggersglüß, Görschwin Fey, Daniel Tille:
Test Pattern Generation using Boolean Proof Engines. Springer 2009, ISBN 978-90-481-2359-9, pp. I-XII, 1-192
Journal Articles
- 2024
- [j11]Janusz Rajski, Vivek Chickermane, Jean-François Côté, Stephan Eggersglüß, Nilanjan Mukherjee, Jerzy Tyszer:
The Future of Design for Test and Silicon Lifecycle Management. IEEE Des. Test 41(4): 35-49 (2024) - 2023
- [j10]Stephan Eggersglüß, Sylwester Milewski, Janusz Rajski, Jerzy Tyszer:
A New Static Compaction of Deterministic Test Sets. IEEE Trans. Very Large Scale Integr. Syst. 31(4): 411-420 (2023) - 2016
- [j9]Stephan Eggersglüß, Kenneth Schmitz, Rene Krenz-Baath, Rolf Drechsler:
On Optimization-Based ATPG and Its Application for Highly Compacted Test Sets. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35(12): 2104-2117 (2016) - 2014
- [j8]Stephan Eggersglüß:
Dynamic X-filling for Peak Capture Power Reduction for Compact Test Sets. J. Electron. Test. 30(5): 557-567 (2014) - [j7]Stephan Eggersglüß, Rolf Drechsler:
An effective fault ordering heuristic for SAT-based dynamic test compaction techniques. it Inf. Technol. 56(4): 157-164 (2014) - 2012
- [j6]Stephan Eggersglüß, Rolf Drechsler:
A Highly Fault-Efficient SAT-Based ATPG Flow. IEEE Des. Test Comput. 29(4): 63-70 (2012) - 2011
- [j5]Stephan Eggersglüß, Rolf Drechsler:
Efficient Data Structures and Methodologies for SAT-Based ATPG Providing High Fault Coverage in Industrial Application. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 30(9): 1411-1415 (2011) - 2010
- [j4]Stephan Eggersglüß, Görschwin Fey, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel, Rolf Drechsler:
MONSOON: SAT-Based ATPG for Path Delay Faults Using Multiple-Valued Logics. J. Electron. Test. 26(3): 307-322 (2010) - [j3]Daniel Tille, Stephan Eggersglüß, Rolf Drechsler:
Incremental Solving Techniques for SAT-based ATPG. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 29(7): 1125-1130 (2010) - 2009
- [j2]Rolf Drechsler, Stephan Eggersglüß, Görschwin Fey, Jürgen Schlöffel, Daniel Tille:
Effiziente Erfüllbarkeitsalgorithmen für die Generierung von Testmustern (Efficient Satisfiability Solving Algorithms for Test Pattern Generation). it Inf. Technol. 51(2): 102-111 (2009) - 2008
- [j1]Rolf Drechsler, Stephan Eggersglüß, Görschwin Fey, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel, Daniel Tille:
On Acceleration of SAT-Based ATPG for Industrial Designs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27(7): 1329-1333 (2008)
Conference and Workshop Papers
- 2024
- [c42]Stephan Eggersglüß, Andreas Glowatz:
A Cell-aware Transistor State Stress Model and its Application for Quality Measurement. ITC 2024: 41-45 - 2021
- [c41]Stephan Eggersglüß, Sylwester Milewski, Janusz Rajski, Jerzy Tyszer:
On Reduction of Deterministic Test Pattern Sets. ITC 2021: 260-267 - 2019
- [c40]Harshad Dhotre, Stephan Eggersglüß, Krishnendu Chakrabarty, Rolf Drechsler:
Machine Learning-based Prediction of Test Power. ETS 2019: 1-6 - [c39]Stephan Eggersglüß:
Towards Complete Fault Coverage by Test Point Insertion using Optimization-SAT Techniques. ITC 2019: 1-8 - [c38]Stephan Eggersglüß, Said Hamdioui, Artur Jutman, Maria K. Michael, Jaan Raik, Matteo Sonza Reorda, Mehdi Baradaran Tahoori, Elena-Ioana Vatajelu:
IEEE European Test Symposium (ETS). ITC 2019: 1-4 - [c37]Stephan Eggersglüß:
Towards Complete Fault Coverage by Test Point Insertion using Optimization-SAT Techniques. ITC-Asia 2019: 67-72 - [c36]Harshad Dhotre, Stephan Eggersglüß, Rolf Drechsler:
Cluster-based Localization of IR-drop in Test Application considering Parasitic Elements. LATS 2019: 1-4 - 2018
- [c35]Arun Chandrasekharan, Stephan Eggersglüß, Daniel Große, Rolf Drechsler:
Approximation-aware testing for approximate circuits. ASP-DAC 2018: 239-244 - [c34]Harshad Dhotre, Stephan Eggersglüß, Rolf Drechsler, Mehdi Dehbashi, Ulrike Pfannkuchen:
Constraint-Based Pattern Retargeting for Reducing Localized Power Activity During Testing. DDECS 2018: 79-84 - 2017
- [c33]Harshad Dhotre, Stephan Eggersglüß, Rolf Drechsler:
Identification of Efficient Clustering Techniques for Test Power Activity on the Layout. ATS 2017: 108-113 - [c32]Sebastian Huhn, Stephan Eggersglüß, Krishnendu Chakrabarty, Rolf Drechsler:
Optimization of retargeting for IEEE 1149.1 TAP controllers with embedded compression. DATE 2017: 578-583 - [c31]Harshad Dhotre, Stephan Eggersglüß, Mehdi Dehbashi, Ulrike Pfannkuchen, Rolf Drechsler:
Machine learning based test pattern analysis for localizing critical power activity areas. DFT 2017: 1-6 - [c30]Sebastian Huhn, Stephan Eggersglüß, Rolf Drechsler:
Reconfigurable TAP controllers with embedded compression for large test data volume. DFT 2017: 1-6 - [c29]Maria K. Michael, Rolf Drechsler, Stephan Eggersglüß, Haralampos-G. D. Stratigopoulos, Sybille Hellebrand, Rob Aitken:
Foreword. ETS 2017: 1-2 - [c28]Sebastian Huhn, Heike Sonnenberg, Stephan Eggersglüß, Brigitte Clausen, Rolf Drechsler:
Revealing properties of structural materials by combining regression-based algorithms and nano indentation measurements. SSCI 2017: 1-6 - 2016
- [c27]Stephan Eggersglüß, Stefan Holst, Daniel Tille, Kohei Miyase, Xiaoqing Wen:
Formal Test Point Insertion for Region-based Low-Capture-Power Compact At-Speed Scan Test. ATS 2016: 173-178 - [c26]Stephan Eggersglüß, Kohei Miyase, Xiaoqing Wen:
SAT-based post-processing for regional capture power reduction in at-speed scan test generation. ETS 2016: 1-6 - [c25]Sebastian Huhn, Stephan Eggersglüß, Rolf Drechsler:
VecTHOR: Low-cost compression architecture for IEEE 1149-compliant TAP controllers. ETS 2016: 1-6 - [c24]Rolf Drechsler, Stephan Eggersglüß, Nils Ellendt, Sebastian Huhn, Lutz Mädler:
Exploring superior structural materials using multi-objective optimization and formal techniques. ISED 2016: 13-17 - 2015
- [c23]Stephan Eggersglüß:
Compact test set generation for test compression-based designs. ETS 2015: 1-6 - 2014
- [c22]Bernd Becker, Rolf Drechsler, Stephan Eggersglüß, Matthias Sauer:
Recent advances in SAT-based ATPG: Non-standard fault models, multi constraints and optimization. DTIS 2014: 1-10 - [c21]Stephan Eggersglüß, Kenneth Schmitz, Rene Krenz-Baath, Rolf Drechsler:
Optimization-based multiple target test generation for highly compacted test sets. ETS 2014: 1-6 - [c20]Mehdi Dehbashi, Daniel Tille, Ulrike Pfannkuchen, Stephan Eggersglüß:
Automated formal verification of X propagation with respect to testability issues. IDT 2014: 106-111 - 2013
- [c19]Stephan Eggersglüß:
Peak Capture Power Reduction for Compact Test Sets Using Opt-Justification-Fill. Asian Test Symposium 2013: 31-36 - [c18]Stephan Eggersglüß, Robert Wille, Rolf Drechsler:
Improved SAT-based ATPG: more constraints, better compaction. ICCAD 2013: 85-90 - [c17]Rolf Drechsler, Melanie Diepenbeck, Stephan Eggersglüß, Robert Wille:
PASSAT 2.0: A multi-functional SAT-based testing framework. LATW 2013: 1 - 2012
- [c16]Stephan Eggersglüß, Mahmut Yilmaz, Krishnendu Chakrabarty:
Robust Timing-Aware Test Generation Using Pseudo-Boolean Optimization. Asian Test Symposium 2012: 290-295 - [c15]Stephan Eggersglüß, Rene Krenz-Baath, Andreas Glowatz, Friedrich Hapke, Rolf Drechsler:
A new SAT-based ATPG for generating highly compacted test sets. DDECS 2012: 230-235 - 2011
- [c14]Stephan Eggersglüß, Rolf Drechsler:
As-Robust-As-Possible test generation in the presence of small delay defects using pseudo-Boolean optimization. DATE 2011: 1291-1296 - 2010
- [c13]Daniel Tille, Stephan Eggersglüß, Rene Krenz-Baath, Jürgen Schlöffel, Rolf Drechsler:
Improving CNF representations in SAT-based ATPG for industrial circuits using BDDs. ETS 2010: 176-181 - [c12]Stephan Eggersglüß, Daniel Tille, Rolf Drechsler:
Efficient test generation with maximal crosstalk-induced noise using unconstrained aggressor excitation. ISCAS 2010: 649-652 - 2009
- [c11]Stephan Eggersglüß, Daniel Tille, Rolf Drechsler:
Speeding up SAT-Based ATPG Using Dynamic Clause Activation. Asian Test Symposium 2009: 177-182 - [c10]Stephan Eggersglüß, Rolf Drechsler:
Increasing Robustness of SAT-based Delay Test Generation Using Efficient Dynamic Learning Techniques. ETS 2009: 81-86 - [c9]Murthy Palla, Jens Bargfrede, Stephan Eggersglüß, Walter Anheier, Rolf Drechsler:
Timing Arc based logic analysis for false noise reduction. ICCAD 2009: 225-230 - 2008
- [c8]Stephan Eggersglüß, Rolf Drechsler:
On the Influence of Boolean Encodings in SAT-Based ATPG for Path Delay Faults. ISMVL 2008: 94-99 - 2007
- [c7]Stephan Eggersglüß, Rolf Drechsler:
Improving Test Pattern Compactness in SAT-based ATPG. ATS 2007: 445-452 - [c6]Stephan Eggersglüß, Görschwin Fey, Rolf Drechsler:
SAT-based ATPG for Path Delay Faults in Sequential Circuits. ISCAS 2007: 3671-3674 - [c5]Stephan Eggersglüß, Daniel Tille, Görschwin Fey, Rolf Drechsler, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel:
Experimental Studies on SAT-Based ATPG for Gate Delay Faults. ISMVL 2007: 6 - [c4]Görschwin Fey, Daniel Große, Stephan Eggersglüß, Robert Wille, Rolf Drechsler:
Formal Verification on the Word Level using SAT-like Proof Techniques. MBMV 2007: 81-90 - [c3]Stephan Eggersglüß, Görschwin Fey, Rolf Drechsler, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel:
Combining Multi-Valued Logics in SAT-based ATPG for Path Delay Faults. MEMOCODE 2007: 181-187 - [c2]Robert Wille, Görschwin Fey, Daniel Große, Stephan Eggersglüß, Rolf Drechsler:
SWORD: A SAT like Prover Using Word Level Information. VLSI-SoC (Selected Papers) 2007: 1-17 - [c1]Robert Wille, Görschwin Fey, Daniel Große, Stephan Eggersglüß, Rolf Drechsler:
SWORD: A SAT like prover using word level information. VLSI-SoC 2007: 88-93
Parts in Books or Collections
- 2010
- [p1]Stephan Eggersglüß:
Robuste Erfüllbarkeitsalgorithmen zur Generierung hochwertiger Testmuster für digitale Schaltungen. Ausgezeichnete Informatikdissertationen 2010: 81-90
Informal and Other Publications
- 2008
- [i1]Rolf Drechsler, Stephan Eggersglüß, Görschwin Fey, Daniel Tille:
SAT-based Automatic Test Pattern Generation. Evolutionary Test Generation 2008
Coauthor Index
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