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ORCIDGlenn H. Chapman
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- affiliation: Simon Fraser University, Canada
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2020 – today
- 2023
[c60]Glenn H. Chapman, Klinsmann J. Coelho Silva Meneses, Linda Wu, Israel Koren, Zahava Koren:
Image Degradation in Time Due to Interacting Hot Pixels. DFT 2023: 1-6- 2022
- [c59]Glenn H. Chapman, Klinsmann J. Coelho Silva Meneses, Israel Koren, Zahava Koren:
Image Degradation due to Interacting Adjacent Hot Pixels. DFT 2022: 1-6 - 2021
- [c58]Glenn H. Chapman, Simone Neufeld, Klinsmann J. Coelho Silva Meneses, Israel Koren, Zahava Koren:
Dependence of SEUs in Digital Cameras on Pixel size and Elevation. DFT 2021: 1-4 - [c57]Vijay K. Jain, Glenn H. Chapman:
Fault Tolerance for Islandable-Microgrid Sensors. DFT 2021: 1-4 - 2020
- [c56]Glenn H. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Ruoyi Zhao, Israel Koren, Zahava Koren:
Using digital imagers to characterize the dependence of energy and area distributions of SEUs on elevation. DFT 2020: 1-4
2010 – 2019
- 2019
- [c55]Glenn H. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Bifei Huang, Hao Yang, Israel Koren, Zahava Koren:
Detecting SEUs in Noisy Digital Imagers with small pixels. DFT 2019: 1-6 - [c54]Glenn H. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Israel Koren, Zahava Koren:
Image degradation from hot pixel defects with pixel size shrinkage. IMSE 2019: 1-7 - 2018
- [c53]Glenn H. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Israel Koren, Zahava Koren:
Analysis of Single Event Upsets Based on Digital Cameras with Very Small Pixels. DFT 2018: 1-6 - [c52]Glenn H. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Parham Purbakht, Israel Koren, Zahava Koren:
Exploring Hot Pixel Characteristics for 7 to 1.3 micron Pixels. IMSE 2018: 1-6 - 2017
- [c51]Glenn H. Chapman, Parham Purbakht, Peter Le, Israel Koren, Zahava Koren:
Exploring soft errors (SEUs) with digital imager pixels ranging from 7 to 1.3 μm. DFT 2017: 1-4 - [c50]Glenn H. Chapman, Rahul Thomas, Israel Koren, Zahava Koren:
Hot Pixel Behavior as Pixel Size Reduces to 1 micron. IMSE 2017: 39-45 - [c49]David Stevens
, Bonnie L. Gray, David Yin, Glenn H. Chapman, Daniel B. Leznoff:
Post arrays for the immobilization of vapochromic coordination polymers for chemical sensors. IEEE SENSORS 2017: 1-3 - 2016
- [c48]Glenn H. Chapman, Rahul Thomas, Rohan Thomas, Israel Koren, Zahava Koren:
Experimental study and analysis of soft and permanent errors in digital cameras. DFT 2016: 11-14 - [c47]Glenn H. Chapman, Rahul Thomas, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Tommy Q. Yang, Israel Koren, Zahava Koren:
Increases in Hot Pixel Development Rates for Small Digital Pixel Sizes. IMSE 2016: 1-6 - 2015
- [c46]Glenn H. Chapman, Rahul Thomas, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Tommy Q. Yang, Israel Koren, Zahava Koren:
Single Event Upsets and Hot Pixels in digital imagers. DFTS 2015: 41-46 - [c45]Glenn H. Chapman, Rahul Thomas, Rohit Thomas, Zahava Koren, Israel Koren:
Enhanced correction methods for high density hot pixel defects in digital imagers. IMSE 2015: 94030T - 2014
- [c44]Glenn H. Chapman, Rohit Thomas, Rahul Thomas, Israel Koren, Zahava Koren:
Improved correction for hot pixels in digital imagers. DFT 2014: 116-121 - [c43]Glenn H. Chapman, Rohit Thomas, Zahava Koren, Israel Koren:
Correcting high-density hot pixel defects in digital imagers. IMSE 2014: 90220G - 2013
- [c42]Glenn H. Chapman, Rohit Thomas, Israel Koren, Zahava Koren:
Improved image accuracy in Hot Pixel degraded digital cameras. DFTS 2013: 172-177 - [c41]Glenn H. Chapman, Rohit Thomas, Zahava Koren, Israel Koren:
Empirical formula for rates of hot pixel defects based on pixel size, sensor area, and ISO. Sensors, Cameras, and Systems for Industrial and Scientific Applications 2013: 86590C - 2012
- [c40]Glenn H. Chapman, Rohit Thomas, Israel Koren, Zahava Koren:
Relating digital imager defect rates to pixel size, sensor area and ISO. DFT 2012: 164-169 - [c39]Glenn H. Chapman, Jenny Leung, Rohit Thomas, Ana I. L. Namburete, Zahava Koren, Israel Koren:
Projecting the rate of in-field pixel defects based on pixel size, sensor area, and ISO. Sensors, Cameras, and Systems for Industrial and Scientific Applications 2012: 82980E - [c38]Glenn H. Chapman, Israel Koren, Zahava Koren:
Do more camera pixels result in a better picture? IOLTS 2012: 73-78 - 2011
- [c37]Glenn H. Chapman, Bonnie L. Gray, Vijay K. Jain:
Creating Defect Tolerance in Microfluidic Capacitive/Photonic Biosensors. DFT 2011: 181-189 - [c36]Vijay K. Jain, Glenn H. Chapman:
Enhanced Defect Tolerance through Matrixed Deployment of Intelligent Sensors for the Smart Power Grid. DFT 2011: 235-242 - [c35]Glenn H. Chapman, Jenny Leung, Ana I. L. Namburete, Israel Koren, Zahava Koren:
Predicting Pixel Defect Rates Based on Image Sensor Parameters. DFT 2011: 408-416 - [c34]Glenn H. Chapman, Jenny Leung, Rahul Thomas, Zahava Koren, Israel Koren:
Tradeoffs in imager design parameters for sensor reliability. Sensors, Cameras, and Systems for Industrial, Scientific, and Consumer Applications 2011: 78750I - [c33]Phanindra Kalyanam, Glenn H. Chapman, M. Parameswaran:
Simulating enhanced photo carrier collection in the multifinger photogate active pixel sensors. Sensors, Cameras, and Systems for Industrial, Scientific, and Consumer Applications 2011: 787508 - 2010
- [c32]Glenn H. Chapman, Jenny Leung, Israel Koren, Zahava Koren:
Tradeoffs in Imager Design with Respect to Pixel Defect Rates. DFT 2010: 231-239 - [c31]Vijay K. Jain, Glenn H. Chapman:
Massively Deployable Intelligent Sensors for the Smart Power Grid. DFT 2010: 319-327
2000 – 2009
- 2009
- [c30]Jenny Leung, Glenn H. Chapman, Israel Koren, Zahava Koren:
Characterization of Gain Enhanced In-Field Defects in Digital Imagers. DFT 2009: 155-163 - [c29]Jenny Leung, Glenn H. Chapman, Zahava Koren, Israel Koren:
Statistical identification and analysis of defect development in digital imagers. Digital Photography 2009: 72500 - 2008
- [c28]Glenn H. Chapman, Vijay K. Jain:
Defect Tolerance for a Capacitance Based Nanoscale Biosensor. DFT 2008: 220-228 - [c27]Jenny Leung, Glenn H. Chapman, Israel Koren, Zahava Koren:
Automatic Detection of In-field eld Defect Growth in Image Sensors. DFT 2008: 305-313 - 2007
- [c26]Jozsef Dudas, Michelle L. La Haye, Jenny Leung, Glenn H. Chapman:
A Fault-Tolerant Active Pixel Sensor to Correct In-Field Hot Pixel Defects. DFT 2007: 517-525 - [c25]Jenny Leung, Jozsef Dudas, Glenn H. Chapman, Israel Koren, Zahava Koren:
Quantitative Analysis of In-Field Defects in Image Sensor Arrays. DFT 2007: 526-534 - [c24]Jozsef Dudas, Linda Wu, Cory Jung, Glenn H. Chapman, Zahava Koren, Israel Koren:
Identification of in-field defect development in digital image sensors. Digital Photography 2007: 65020Y - [c23]James Dykes, Paulman Chan, Glenn H. Chapman, Lesley Shannon:
A Multiprocessor System-on-Chip Implementation of a Laser-based Transparency Meter on an FPGA. FPT 2007: 373-376 - 2006
- [c22]Vijay K. Jain, Glenn H. Chapman:
Defect Tolerant and Energy Economized DSP Plane of a 3-D Heterogeneous SoC. DFT 2006: 157-165 - [c21]Jozsef Dudas, Cory Jung, Linda Wu, Glenn H. Chapman, Israel Koren, Zahava Koren:
On-Line Mapping of In-Field Defects in Image Sensor Arrays. DFT 2006: 439-447 - [c20]Michelle L. La Haye, Cory Jung, David Chen, Glenn H. Chapman, Jozsef Dudas:
Fault Tolerant Active Pixel Sensors in 0.18 and 0.35 Micron Technologies. DFT 2006: 448-456 - [c19]Fartash Vasefi, Paulman K. Y. Chan, Bozena Kaminska, Glenn H. Chapman:
Subsurface Bioimaging using Angular Domain Optical Backscattering Illumination. EMBC 2006: 1932-1936 - 2005
- [c18]Glenn H. Chapman, Israel Koren, Zahava Koren, Jozsef Dudas, Cory Jung:
On-Line Identification of Faults in Fault-Tolerant Imagers. DFT 2005: 149-157 - [c17]Glenn H. Chapman, Vijay K. Jain, Shekhar Bhansali:
Inter-Plane Via Defect Detection Using the Sensor Plane in 3-D Heterogeneous Sensor Systems. DFT 2005: 158-168 - [c16]Vijay K. Jain, Sanjukta Bhanja, Glenn H. Chapman, Lavanya Doddannagari, Nguyen Nguyen:
A parallel architecture for the ICA algorithm: DSP plane of a 3-D heterogeneous sensor. ICASSP (5) 2005: 77-80 - [c15]Vijay K. Jain, Sanjukta Bhanja, Glenn H. Chapman, Lavanya Doddannagari:
A highly reconfigurable computing array: DSP plane of a 3D heterogeneous SoC. SoCC 2005: 243-246 - 2004
- [j7]Glenn H. Chapman, Sunjaya Djaja, Desmond Y. H. Cheung, Yves Audet, Israel Koren, Zahava Koren:
A Self-Correcting Active Pixel Sensor Using Hardware and Software Correction. IEEE Des. Test Comput. 21(6): 544-551 (2004) - [c14]Michelle L. La Haye, Glenn H. Chapman, Cory Jung, Desmond Y. H. Cheung, Sunjaya Djaja, Benjamin Wang, Gary Liaw, Yves Audet:
Characteristics of Fault-Tolerant Photodiode and Photogate Active Pixel Sensor (APS). DFT 2004: 58-66 - [c13]Glenn H. Chapman, Vijay K. Jain, Shekhar Bhansali:
Defect Avoidance in a 3-D Heterogeneous Sensor. DFT 2004: 67-75 - 2003
- [j6]Régis Leveugle, Glenn H. Chapman:
Special section on defect and fault tolerance in VLSI systems. Microelectron. J. 34(1): 1 (2003) - [c12]Vijay K. Jain, Glenn H. Chapman:
Level-Hybrid Optoelectronic TESH Interconnection Network. DFT 2003: 45-52 - [c11]Sunjaya Djaja, Glenn H. Chapman, Desmond Y. H. Cheung, Yves Audet:
Implementation and Testing of Fault-Tolerant Photodiode-Based Active Pixel Sensor (APS). DFT 2003: 53- - 2001
- [c10]Israel Koren, Zahava Koren, Glenn H. Chapman:
Advanced Fault-Tolerance Techniques for a Color Digital Camera-on-a-Chip. DFT 2001: 3-10 - [c9]Yves Audet, Glenn H. Chapman:
Design of a Self-Correcting Active Pixel Sensor. DFT 2001: 18- - 2000
- [c8]Israel Koren, Zahava Koren, Glenn H. Chapman:
A Self-Correcting Active Pixel Camera. DFT 2000: 56-
1990 – 1999
- 1999
- [c7]Glenn H. Chapman, Yves Audet:
Creating 35 mm Camera Active Pixel Sensors. DFT 1999: 22-30 - 1998
- [j5]Glenn H. Chapman, Benoit Dufort:
Using Laser Defect Avoidance to Build Large-Area FPGAs. IEEE Des. Test Comput. 15(4): 75-81 (1998) - [c6]Glenn H. Chapman:
FPGA Design for Decimeter Scale Integration (DMSI). DFT 1998: 64-72 - 1997
- [j4]Stuart K. Tewksbury, Glenn H. Chapman:
Guest Editorial Foreword to the Special Section on WSI'95. IEEE Trans. Very Large Scale Integr. Syst. 5(1): 1-2 (1997) - [j3]Yves Audet, Glenn H. Chapman:
Yield improvement of a large area magnetic field sensor array using redundancy schemes. IEEE Trans. Very Large Scale Integr. Syst. 5(1): 28-33 (1997) - [c5]Glenn H. Chapman, Benoit Dufort:
Laser defect correction applications to FPGA based custom computers. FCCM 1997: 240-241 - [c4]Glenn H. Chapman, Benoit Dufort:
Laser Correcting Defects to Create Transparent Routing for Large Area FPGA's. FPGA 1997: 17-23 - 1996
- [c3]Glenn H. Chapman, Benoit Dufort:
Making defect avoidance nearly invisible to the user in wafer scale field programmable gate arrays. DFT 1996: 11-20 - 1995
- [c2]Glenn H. Chapman, D. E. Bergen, K. Fang:
Wafer-scale integration defect avoidance tradeoffs between laser links and Omega network switching. DFT 1995: 37-45 - 1994
- [c1]Glenn H. Chapman:
Laser Processes for Defect Correction in Large Area VLSI Systems. DFT 1994: 106-114 - 1992
- [j2]Glenn H. Chapman, M. Parameswaran, Marek Syrzycki:
Wafer-Scale Transducer Arrays. Computer 25(4): 50-56 (1992)
1980 – 1989
- 1988
- [j1]F. Matthew Rhodes, Joseph J. Dituri, Glenn H. Chapman, Bruce E. Emerson, Antonio M. Soares, Jack I. Raffel:
A Monolithic Hough Transform Processor Based on Restructurable VLSI. IEEE Trans. Pattern Anal. Mach. Intell. 10(1): 106-110 (1988)
Coauthor Index
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