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"Empirical formula for rates of hot pixel defects based on pixel size, ..."

Glenn H. Chapman et al. (2013)

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DOI: 10.1117/12.2005850

access: closed

type: Conference or Workshop Paper

metadata version: 2023-08-02

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  - conf/ei-iss/ChapmanTKK13
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Glenn H. Chapman, Rohit Thomas, Zahava Koren, Israel Koren:
Empirical formula for rates of hot pixel defects based on pixel size, sensor area, and ISO. Sensors, Cameras, and Systems for Industrial and Scientific Applications 2013: 86590C

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