DFT 1999: Albuquerque, NM, USA

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Session 1: Yield I

Session 2: Yield II

Session 3: Testing Techniques

Session 4: Built-In Self-Test Architectures

Session 5: Fault Modeling and Simulation

Session 6: Design for Testing

Session 7: Self-Checking Processing Units and Systems

Session 8: Self-Checking Memories and Interconnections

Session 9: Diagnosis

Session 10: Reconfiguration

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