"Electrical Characteristics and Testing Considerations for Gate Oxide ..."

Jerry M. Soden, Charles F. Hawkins (1985)

> Home

Details and statistics

DOI: —

access: unavailable

type: Conference or Workshop Paper

metadata version: 2002-11-11

- no documents available
- export record
  dblp key:
  - conf/itc/SodenH85
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc/SodenH85
Jerry M. Soden, Charles F. Hawkins:
Electrical Characteristics and Testing Considerations for Gate Oxide Shorts in CMOS ICs. ITC 1985: 544-557

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.