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ORCIDInternational Test Conference (ITC)
ITC 2024: San Diego, CA, USA
- IEEE International Test Conference, ITC 2024, San Diego, CA, USA, November 3-8, 2024. IEEE 2024, ISBN 979-8-3315-2013-7 [contents]
ITC 2023: Anaheim, CA, USA
- IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023. IEEE 2023, ISBN 979-8-3503-4325-0 [contents]
ITC 2022: Anaheim, CA, USA
- IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022. IEEE 2022, ISBN 978-1-6654-6270-9 [contents]
ITC 2021: Anaheim, CA, USA
- IEEE International Test Conference, ITC 2021, Anaheim, CA, USA, October 10-15, 2021. IEEE 2021, ISBN 978-1-6654-1695-5 [contents]
ITC 2020: Washington, DC, USA
- IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020. IEEE 2020, ISBN 978-1-7281-9113-3 [contents]
ITC 2019: Washington, DC, USA
- IEEE International Test Conference, ITC 2019, Washington, DC, USA, November 9-15, 2019. IEEE 2019, ISBN 978-1-7281-4823-6 [contents]
ITC 2018: Phoenix, AZ, USA
- IEEE International Test Conference, ITC 2018, Phoenix, AZ, USA, October 29 - Nov. 1, 2018. IEEE 2018, ISBN 978-1-5386-8382-8 [contents]
ITC 2017: Fort Worth, TX, USA
- IEEE International Test Conference, ITC 2017, Fort Worth, TX, USA, October 31 - Nov. 2, 2017. IEEE 2017, ISBN 978-1-5386-3413-4 [contents]
ITC 2016: Fort Worth, TX, USA
- 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016. IEEE 2016, ISBN 978-1-4673-8773-6 [contents]
ITC 2015: Anaheim, CA, USA
- 2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015. IEEE 2015, ISBN 978-1-4673-6578-9 [contents]
ITC 2014: Seattle, WA, USA
- 2014 International Test Conference, ITC 2014, Seattle, WA, USA, October 20-23, 2014. IEEE Computer Society 2014, ISBN 978-1-4799-4722-5 [contents]
ITC 2013: Anaheim, CA, USA
- 2013 IEEE International Test Conference, ITC 2013, Anaheim, CA, USA, September 6-13, 2013. IEEE Computer Society 2013, ISBN 978-1-4799-0859-2 [contents]
ITC 2012: Anaheim, CA, USA
- 2012 IEEE International Test Conference, ITC 2012, Anaheim, CA, USA, November 5-8, 2012. IEEE Computer Society 2012, ISBN 978-1-4673-1594-4 [contents]
ITC 2011: Anaheim, CA, USA
- Bill Eklow, R. D. (Shawn) Blanton:
2011 IEEE International Test Conference, ITC 2011, Anaheim, CA, USA, September 20-22, 2011. IEEE Computer Society 2011, ISBN 978-1-4577-0153-5 [contents]
ITC 2010: Austin, TX, USA
- Ron Press, Erik H. Volkerink:
2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010. IEEE Computer Society 2010, ISBN 978-1-4244-7206-2 [contents]
ITC 2009: Austin, TX, USA
- Gordon W. Roberts, Bill Eklow:
2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009. IEEE Computer Society 2009, ISBN 978-1-4244-4868-5 [contents]
ITC 2008: Santa Clara, California, USA
- Douglas Young, Nur A. Touba:
2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008. IEEE Computer Society 2008, ISBN 978-1-4244-2403-0 [contents]
ITC 2007: Santa Clara, California, USA
- Jill Sibert, Janusz Rajski:
2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007. IEEE Computer Society 2007, ISBN 1-4244-1128-9 [contents]
ITC 2006: Santa Clara, California, USA
- Scott Davidson, Anne Gattiker:
2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006. IEEE Computer Society 2006, ISBN 1-4244-0292-1 [contents]
ITC 2005: Austin, TX, USA
- Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005. IEEE Computer Society 2005, ISBN 0-7803-9038-5 [contents]
ITC 2004: Charlotte, NC, USA
- Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA. IEEE Computer Society 2003, ISBN 0-7803-8581-0 [contents]
ITC 2003: Charlotte, NC, USA
- Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. IEEE Computer Society 2003, ISBN 0-7803-8106-8 [contents]
ITC 2002: Baltimore, MD, USA
- Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002. IEEE Computer Society 2002, ISBN 0-7803-7543-2 [contents]
ITC 2001: Baltimore, MD, USA
- Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001. IEEE Computer Society 2001, ISBN 0-7803-7169-0 [contents]
ITC 2000: Atlantic City, NJ, USA
- Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000. IEEE Computer Society 2000, ISBN 0-7803-6546-1 [contents]
ITC 1999: Atlantic City, NJ, USA
- Proceedings IEEE International Test Conference 1999, Atlantic City, NJ, USA, 27-30 September 1999. IEEE Computer Society 1999, ISBN 0-7803-5753-1 [contents]
ITC 1998: Washington, DC, USA
- Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998. IEEE Computer Society 1998, ISBN 0-7803-5093-6 [contents]
ITC 1997: Washington, DC, USA
- Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997. IEEE Computer Society 1997, ISBN 0-7803-4209-7 [contents]
ITC 1996: Washington, DC, USA
- Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996. IEEE Computer Society 1996, ISBN 0-7803-3541-4 [contents]
ITC 1995: Washington, DC, USA
- Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995. IEEE Computer Society 1995, ISBN 0-7803-2992-9 [contents]
ITC 1994: Washington, DC, USA
- Proceedings IEEE International Test Conference 1994, TEST: The Next 25 Years, Washington, DC, USA, October 2-6, 1994. IEEE Computer Society 1994, ISBN 0-7803-2103-0 [contents]
ITC 1993: Baltimore, MD, USA
- Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October 17-21, 1993. IEEE Computer Society 1993, ISBN 0-7803-1430-1 [contents]
ITC 1992: Baltimore, MD, USA
- Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992. IEEE Computer Society 1992, ISBN 0-7803-0760-7 [contents]
ITC 1991: Nashville, TN, USA
- Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991. IEEE Computer Society 1991, ISBN 0-8186-9156-5 [contents]
ITC 1990: Washington, DC, USA
- Proceedings IEEE International Test Conference 1990, Washington, D.C., USA, September 10-14, 1990. IEEE Computer Society 1990, ISBN 0-8186-9064-X [contents]
ITC 1989: Washington, D.C., USA
- Proceedings International Test Conference 1989, Washington, D.C., USA, August 1989. IEEE Computer Society 1989 [contents]
ITC 1988: Washington, D.C., USA
- Proceedings International Test Conference 1988, Washington, D.C., USA, September 1988. IEEE Computer Society 1988, ISBN 0-8186-0870-6 [contents]
ITC 1986: Washington, D.C., USA
- Proceedings International Test Conference 1986, Washington, D.C., USA, September 1986. IEEE Computer Society 1986 [contents]
ITC 1985: Philadelphia, PA, USA
- Proceedings International Test Conference 1985, Philadelphia, PA, USA, November 1985. IEEE Computer Society 1985 [contents]
ITC 1984: Philadelphia, PA, USA
- Proceedings International Test Conference 1984, Philadelphia, PA, USA, October 1984. IEEE Computer Society 1984 [contents]
ITC 1983: Philadelphia, PA, USA
- Proceedings International Test Conference 1983, Philadelphia, PA, USA, October 1983. IEEE Computer Society 1983 [contents]
ITC 1982: Philadelphia, PA, USA
- Proceedings International Test Conference 1982, Philadelphia, PA, USA, November 1982. IEEE Computer Society 1982 [contents]
ITC 1981: Philadelphia, PA, USA
- Proceedings International Test Conference 1981, Philadelphia, PA, USA, October 1981. IEEE Computer Society 1981 [contents]
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