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conf/irps/Garba-SeybouFBC21 share record
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Tidjani Garba-Seybou , Xavier Federspiel , Alain Bravaix , Florian Cacho : Analysis of the interactions of HCD under "On" and "Off" state modes for 28nm FDSOI AC RF modelling. IRPS 2021 : 1-5 export record
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conf/irps/GerrerCGGFCRV21 share record
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Louis Gerrer , Jacques Cluzel , Fred Gaillard , Xavier Garros , Xavier Federspiel , Florian Cacho , David Roy , E. Vincent : BTI Arbitrary Stress Patterns Characterization & Machine-Learning optimized CET Maps Simulations. IRPS 2021 : 1-5 share record
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Tibor Grasser , Barry J. O'Sullivan , Ben Kaczer , Jacopo Franco , Bernhard Stampfer , Michael Waltl : CV Stretch-Out Correction after Bias Temperature Stress: Work-Function Dependence of Donor-/Acceptor-Like Traps, Fixed Charges, and Fast States. IRPS 2021 : 1-6 share record
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Aniket Gupta , Govind Bajpai , Priyanshi Singhal , Navjeet Bagga , Om Prakash , Shashank Banchhor , Hussam Amrouch , Nitanshu Chauhan : Traps Based Reliability Barrier on Performance and Revealing Early Ageing in Negative Capacitance FET. IRPS 2021 : 1-6 export record
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conf/irps/HanLSNJOHJLLSHJ21 share record
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Shinhee Han , Junghyuk Lee , Kiseok Suh , Kyungtae Nam , Daeeun Jeong , Sechung Oh , Sohee Hwang , Yongsung Ji , Kilho Lee , Kangho Lee , Yoonjong Song , Yeongki Hong , Gitae Jeong : Reliability of STT-MRAM for various embedded applications. IRPS 2021 : 1-5 share record
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Jin-Woo Han , M. Meyyappan , Jungsik Kim : Single Event Hard Error due to Terrestrial Radiation. IRPS 2021 : 1-6 share record
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Lixia Han , Yachen Xiang , Peng Huang , Guihai Yu , Runze Han , Xiaoyan Liu , Jinfeng Kang : Novel Weight Mapping Method for Reliable NVM based Neural Network. IRPS 2021 : 1-6 share record
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Jifa Hao , Yuhang Sun , Amartya Ghosh : Charge pumping source-drain current for gate oxide interface trap density in MOSFETs and LDMOS. IRPS 2021 : 1-4 share record
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Wangxin He , Wonbo Shim , Shihui Yin , Xiaoyu Sun , Deliang Fan , Shimeng Yu , Jae-sun Seo : Characterization and Mitigation of Relaxation Effects on Multi-level RRAM based In-Memory Computing. IRPS 2021 : 1-7 export record
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conf/irps/HiblotRTDCSBDK21 share record
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Gaspard Hiblot , Nouredine Rassoul , Lieve Teugels , Katia Devriendt , Adrian Vaisman Chasin , Michiel J. van Setten , Attilio Belmonte , Romain Delhougne , Gouri Sankar Kar : Process-induced charging damage in IGZO nTFTs. IRPS 2021 : 1-8 export record
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conf/irps/HoldenHCKPGDGA21 share record
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Konner E. K. Holden , Gavin D. R. Hall , Michael Cook , Chris Kendrick , Kaitlyn Pabst , Bruce Greenwood , Robin Daugherty , Jeff P. Gambino , Derryl D. J. Allman : Dielectric Relaxation, Aging and Recovery in High-K MIM Capacitors. IRPS 2021 : 1-10 share record
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Shudong Huang , Elyse Rosenbaum : Compact Model of ESD Diode Suitable for Subnanosecond Switching Transients. IRPS 2021 : 1-7 share record
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Shih-che Hung , Shih-Chang Chen , Pei-Shan Chien , Yu-Sheng Cho , Yung-Huei Lee , Wei-Shuo Hung : Time-Efficient Characterization of Time-Dependent Gate Oxide Breakdwon Using Tunable Ramp Voltage Stress (TRVS) Method for Automotive Applications. IRPS 2021 : 1-6 share record
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Kazunari Ishimaru : Challenges of Flash Memory for Next Decade. IRPS 2021 : 1-5 share record
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Sumy Jose , Chunshan Yin , Yu Chen , Cheong Min Hong , Mehul D. Shroff , Xiaoling Zhao , Fan Zhang : An efficient methodology to evaluate BEOL and MOL TDDB in advanced nodes. IRPS 2021 : 1-4 share record
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Sagar Premnath Karalkar , Vishal Ganesan , Milova Paul , Kyong Jin Hwang , Robert Gauthier : Design Optimization of MV-NMOS to Improve Holding Voltage of a 28nm CMOS Technology ESD Power Clamp. IRPS 2021 : 1-5 share record
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Kento Kariya , Atsushi Yumiba , Masaya Ukita , Toru Ikeda , Masaaki Koganemaru , Noriyuki Masago : Study of the microstructure and the mechanical properties of Pb-2.5Ag-2Sn solder joint. IRPS 2021 : 1-4 share record
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Rajesh Kashyap : Silicon lifecycle management (SLM) with in-chip monitoring. IRPS 2021 : 1-4 share record
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Seung-Mo Kim , Thi Mi Hanh Nyugen , Jungwon Oh , Yongsu Lee , Soo Cheol Kang , Ho-In Lee , Cihyun Kim , Surajit Some , Hyeon Jun Hwang , Byoung Hun Lee : Drastic reliability improvement using H2O2/UV treatment of HfO2 for heterogeneous integration. IRPS 2021 : 1-6 share record
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Gang-Jun Kim , Moonjee Yoon , SungHwan Kim , Myeongkyu Eo , Shinhyung Kim , Taehun You , Namhyun Lee , Kijin Kim , Sangwoo Pae : The Characterization of Degradation on various SiON pMOSFET transistors under AC/DC NBTI stress. IRPS 2021 : 1-4 share record
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Dongyoung Kim , Nick Yun , Woongje Sung : Advancing Static Performance and Ruggedness of 600 V SiC MOSFETs: Experimental Analysis and Simulation Study. IRPS 2021 : 1-4 share record
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Ryo Kishida , Ikuo Suda , Kazutoshi Kobayashi : Bias Temperature Instability Depending on Body Bias through Buried Oxide (BOX) Layer in a 65 nm Fully-Depleted Silicon-On-Insulator Process. IRPS 2021 : 1-6 share record
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Mauro J. Kobrinsky , Rahim Kasim : Back End Of Line opportunities and reliability challenges for future technology nodes. IRPS 2021 : 1-2 share record
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Dimple Kochar , Tarun Samadder , Subhadeep Mukhopadhyay , Souvik Mahapatra : Modeling of HKMG Stack Process Impact on Gate Leakage, SILC and PBTI. IRPS 2021 : 1-7 share record
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Joseph P. Kozak , Qihao Song , Ruizhe Zhang , Jingcun Liu , Yuhao Zhang : Robustness of GaN Gate Injection Transistors under Repetitive Surge Energy and Overvoltage. IRPS 2021 : 1-5 export record
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conf/irps/KrishnanSHDL0BJ21 share record
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Gokul Krishnan , Jingbo Sun , Jubin Hazra , Xiaocong Du , Maximilian Liehr , Zheng Li , Karsten Beckmann , Rajiv V. Joshi , Nathaniel C. Cady , Yu Cao : Robust RRAM-based In-Memory Computing in Light of Model Stability. IRPS 2021 : 1-5 share record
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Anastasiia Kruv , Sean R. C. McMitchell , Sergiu Clima , Oguzhan O. Okudur , Nicolo Ronchi , Geert Van den Bosch , Mario Gonzalez , Ingrid De Wolf , Jan Van Houdt : Impact of mechanical strain on wakeup of HfO2 ferroelectric memory. IRPS 2021 : 1-6 share record
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Satyam Kumar , Tarun Samadder , Karansingh Thakor , Uma Sharma , Souvik Mahapatra : Stochastic and Deterministic Modeling Frameworks for Time Kinetics of Gate Insulator Traps During and After Hot Carrier Stress in MOSFETs. IRPS 2021 : 1-5 share record
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Tomohiro Kuyama , Keiichiro Urabe , Koji Eriguchi : Evaluation methodology for assessment of dielectric degradation and breakdown dynamics using time-dependent impedance spectroscopy (TDIS). IRPS 2021 : 1-7 export record
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conf/irps/LamaBBBNCGCNN21 share record
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Giusy Lama , Mathieu Bernard , Nicolas Bernier , Guillaume Bourgeois , Emmanuel Nolot , Niccolo Castellani , Julien Garrione , Marie Claire Cyrille , Gabriele Navarro , Etienne Nowak : Multilevel Programming Reliability in Si-doped GeSbTe for Storage Class Memory. IRPS 2021 : 1-6