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"Time-Efficient Characterization of Time-Dependent Gate Oxide Breakdwon ..."

Shih-che Hung et al. (2021)

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DOI: 10.1109/IRPS46558.2021.9405144

access: closed

type: Conference or Workshop Paper

metadata version: 2021-05-20

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  dblp key:
  - conf/irps/HungCCCLH21
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  - https://dblp.org/rec/conf/irps/HungCCCLH21
Shih-che Hung, Shih-Chang Chen, Pei-Shan Chien, Yu-Sheng Cho, Yung-Huei Lee, Wei-Shuo Hung:
Time-Efficient Characterization of Time-Dependent Gate Oxide Breakdwon Using Tunable Ramp Voltage Stress (TRVS) Method for Automotive Applications. IRPS 2021: 1-6

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