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"Reliability of STT-MRAM for various embedded applications."
Shinhee Han et al. (2021)
- Shinhee Han, Junghyuk Lee, Kiseok Suh, Kyungtae Nam, Daeeun Jeong, Sechung Oh, Sohee Hwang, Yongsung Ji, Kilho Lee, Kangho Lee, Yoonjong Song, Yeongki Hong, Gitae Jeong:
Reliability of STT-MRAM for various embedded applications. IRPS 2021: 1-5
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