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"Charge pumping source-drain current for gate oxide interface trap density ..."

Jifa Hao, Yuhang Sun, Amartya Ghosh (2021)

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DOI: 10.1109/IRPS46558.2021.9405229

access: closed

type: Conference or Workshop Paper

metadata version: 2021-05-05

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  dblp key:
  - conf/irps/HaoSG21
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Jifa Hao, Yuhang Sun, Amartya Ghosh:
Charge pumping source-drain current for gate oxide interface trap density in MOSFETs and LDMOS. IRPS 2021: 1-4

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