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ORCIDTakashi Aikyo
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2010 – 2019
- 2014
[j9]Michihiro Shintani, Takumi Uezono, Tomoyuki Takahashi, Kazumi Hatayama, Takashi Aikyo, Kazuya Masu
, Takashi Sato:
A Variability-Aware Adaptive Test Flow for Test Quality Improvement. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 33(7): 1056-1066 (2014)- 2012
- [j8]Yoshinobu Higami, Satoshi Ohno, Hironori Yamaoka, Hiroshi Takahashi, Yoshihiro Shimizu, Takashi Aikyo:
Generation of Diagnostic Tests for Transition Faults Using a Stuck-At ATPG Tool. IEICE Trans. Inf. Syst. 95-D(4): 1093-1100 (2012) - 2011
- [j7]Kohei Miyase, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Yuta Yamato, Hiroshi Furukawa, Xiaoqing Wen, Seiji Kajihara:
Distribution-Controlled X-Identification for Effective Reduction of Launch-Induced IR-Drop in At-Speed Scan Testing. IEICE Trans. Inf. Syst. 94-D(6): 1216-1226 (2011) - 2010
- [j6]Kohei Miyase, Xiaoqing Wen, Seiji Kajihara, Yuta Yamato, Atsushi Takashima, Hiroshi Furukawa, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Kewal K. Saluja:
A Study of Capture-Safe Test Generation Flow for At-Speed Testing. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 93-A(7): 1309-1318 (2010) - [c23]Takashi Aikyo:
Test Challenge for Deep Sub-micron Era - Test & Diagnosis Platform: STARCAD-Clouseau. DFT 2010: 227
2000 – 2009
- 2009
- [c22]Michihiro Shintani, Takumi Uezono, Tomoyuki Takahashi, Hiroyuki Ueyama, Takashi Sato, Kazumi Hatayama, Takashi Aikyo, Kazuya Masu:
An Adaptive Test for Parametric Faults Based on Statistical Timing Information. Asian Test Symposium 2009: 151-156 - [c21]Kohei Miyase, Yuta Yamato, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Xiaoqing Wen, Seiji Kajihara:
A novel post-ATPG IR-drop reduction scheme for at-speed scan testing in broadcast-scan-based test compression environment. ICCAD 2009: 97-104 - [c20]Yoshinobu Higami, Yosuke Kurose, Satoshi Ohno, Hironori Yamaoka, Hiroshi Takahashi, Yoshihiro Shimizu, Takashi Aikyo, Yuzo Takamatsu:
Diagnostic test generation for transition faults using a stuck-at ATPG tool. ITC 2009: 1-9 - [c19]Koji Yamazaki, Toshiyuki Tsutsumi, Hiroshi Takahashi, Yoshinobu Higami, Takashi Aikyo, Yuzo Takamatsu, Hiroyuki Yotsuyanagi, Masaki Hashizume:
A Novel Approach for Improving the Quality of Open Fault Diagnosis. VLSI Design 2009: 85-90 - [c18]Hiroyuki Yotsuyanagi, Masaki Hashizume, Toshiyuki Tsutsumi, Koji Yamazaki, Takashi Aikyo, Yoshinobu Higami, Hiroshi Takahashi, Yuzo Takamatsu:
Fault Effect of Open Faults Considering Adjacent Signal Lines in a 90 nm IC. VLSI Design 2009: 91-96 - [c17]Masayuki Arai, Akifumi Suto, Kazuhiko Iwasaki, Katsuyuki Nakano, Michihiro Shintani, Kazumi Hatayama, Takashi Aikyo:
Small Delay Fault Model for Intra-Gate Resistive Open Defects. VTS 2009: 27-32 - 2008
- [j5]Yuzo Takamatsu, Hiroshi Takahashi, Yoshinobu Higami, Takashi Aikyo, Koji Yamazaki:
Fault Diagnosis on Multiple Fault Models by Using Pass/Fail Information. IEICE Trans. Inf. Syst. 91-D(3): 675-682 (2008) - [j4]Masayuki Arai, Satoshi Fukumoto, Kazuhiko Iwasaki, Tatsuru Matsuo, Takahisa Hiraide, Hideaki Konishi, Michiaki Emori, Takashi Aikyo:
Test Data Compression for Scan-Based BIST Aiming at 100x Compression Rate. IEICE Trans. Inf. Syst. 91-D(3): 726-735 (2008) - [j3]Hiroshi Takahashi, Yoshinobu Higami, Shuhei Kadoyama, Yuzo Takamatsu, Koji Yamazaki, Takashi Aikyo, Yasuo Sato:
Post-BIST Fault Diagnosis for Multiple Faults. IEICE Trans. Inf. Syst. 91-D(3): 771-775 (2008) - [j2]Seiji Kajihara, Shohei Morishima, Masahiro Yamamoto, Xiaoqing Wen, Masayasu Fukunaga, Kazumi Hatayama, Takashi Aikyo:
Estimation of Delay Test Quality and Its Application to Test Generation. Inf. Media Technol. 3(4): 717-728 (2008) - [j1]Seiji Kajihara, Shohei Morishima, Masahiro Yamamoto, Xiaoqing Wen, Masayasu Fukunaga, Kazumi Hatayama, Takashi Aikyo:
Estimation of Delay Test Quality and Its Application to Test Generation. IPSJ Trans. Syst. LSI Des. Methodol. 1: 104-115 (2008) - [c16]Xiaoqing Wen, Kohei Miyase, Seiji Kajihara, Hiroshi Furukawa, Yuta Yamato, Atsushi Takashima, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Kewal K. Saluja:
A Capture-Safe Test Generation Scheme for At-Speed Scan Testing. ETS 2008: 55-60 - [c15]Kohei Miyase, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Yuta Yamato, Hiroshi Furukawa, Xiaoqing Wen, Seiji Kajihara:
Effective IR-drop reduction in at-speed scan testing using Distribution-Controlling X-Identification. ICCAD 2008: 52-58 - 2007
- [c14]Hiroshi Takahashi, Yoshinobu Higami, Shuhei Kadoyama, Takashi Aikyo, Yuzo Takamatsu, Koji Yamazaki, Toshiyuki Tsutsumi, Hiroyuki Yotsuyanagi, Masaki Hashizume:
Clues for Modeling and Diagnosing Open Faults with Considering Adjacent Lines. ATS 2007: 39-44 - [c13]Anis Uzzaman, Fidel Muradali, Takashi Aikyo, Robert C. Aitken, Tom Jackson, Rajesh Galivanche, Takeshi Onodera:
Test Roles in Diagnosis and Silicon Debug. ATS 2007: 367 - [c12]Takashi Aikyo, Hiroshi Takahashi, Yoshinobu Higami, Junichi Ootsu, Kyohei Ono, Yuzo Takamatsu:
Timing-Aware Diagnosis for Small Delay Defects. DFT 2007: 223-234 - [c11]Hiroshi Takahashi, Yoshinobu Higami, Toru Kikkawa, Takashi Aikyo, Yuzo Takamatsu, Hiroyuki Yotsuyanagi, Masaki Hashizume:
Test Generation and Diagnostic Test Generation for Open Faults with Considering Adjacent Lines. DFT 2007: 243-251 - [c10]Seiji Kajihara, Shohei Morishima, Masahiro Yamamoto, Xiaoqing Wen, Masayasu Fukunaga, Kazumi Hatayama, Takashi Aikyo:
Estimation of delay test quality and its application to test generation. ICCAD 2007: 413-417 - 2006
- [c9]Xijiang Lin, Kun-Han Tsai, Chen Wang, Mark Kassab, Janusz Rajski, Takeo Kobayashi, Randy Klingenberg, Yasuo Sato, Shuji Hamada, Takashi Aikyo:
Timing-Aware ATPG for High Quality At-speed Testing of Small Delay Defects. ATS 2006: 139-146 - [c8]Dhiraj Goswami, Kun-Han Tsai, Mark Kassab, Takeo Kobayashi, Janusz Rajski, Bruce Swanson, Darryl Walters, Yasuo Sato, Toshiharu Asaka, Takashi Aikyo:
At-Speed Testing with Timing Exceptions and Constraints-Case Studies. ATS 2006: 153-162 - [c7]Hiroshi Takahashi, Shuhei Kadoyama, Yoshinobu Higami, Yuzo Takamatsu, Koji Yamazaki, Takashi Aikyo, Yasuo Sato:
Effective Post-BIST Fault Diagnosis for Multiple Faults. DFT 2006: 401-109 - [c6]Masayuki Arai, Satoshi Fukumoto, Kazuhiko Iwasaki, Tatsuru Matsuo, Takahisa Hiraide, Hideaki Konishi, Michiaki Emori, Takashi Aikyo:
Test Data Compression of 100x for Scan-Based BIST. ITC 2006: 1-10 - 2000
- [c5]Takashi Aikyo:
Issues on SOC testing in DSM area: embedded tutorial. ASP-DAC 2000: 515-516
1990 – 1999
- 1997
- [c4]Michiaki Emori, Junko Kumagai, Koichi Itaya, Takashi Aikyo, Tomoko Anan, Junichi Niimi:
ATREX : Design for Testability System for Mega Gate LSIs. Asian Test Symposium 1997: 126- - [c3]Douglas Chang, Mike Tien-Chien Lee, Malgorzata Marek-Sadowska, Takashi Aikyo, Kwang-Ting Cheng:
A Test Synthesis Approach to Reducing BALLAST DFT Overhead. DAC 1997: 466-471 - 1990
- [c2]Michiaki Emori, Takashi Aikyo, Yasuhide Machida, Jun-ichi Shikatani:
ASIC CAD system based on hierarchical design-for-testability. ITC 1990: 404-409
1980 – 1989
- 1986
- [c1]Takashi Aikyo, Y. Hatano, J. Ishii, N. Karasawa, S. Fujii:
An Automatic Test Generation System for Large Scale Gate Arrays. COMPCON 1986: 445-451
Coauthor Index
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