"Estimation of Delay Test Quality and Its Application to Test Generation."

Seiji Kajihara et al. (2008)

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DOI: 10.2197/IPSJTSLDM.1.104

access: closed

type: Journal Article

metadata version: 2020-09-29

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Seiji Kajihara, Shohei Morishima, Masahiro Yamamoto, Xiaoqing Wen, Masayasu Fukunaga, Kazumi Hatayama, Takashi Aikyo:
Estimation of Delay Test Quality and Its Application to Test Generation. IPSJ Trans. Syst. LSI Des. Methodol. 1: 104-115 (2008)

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