"Test Data Compression for Scan-Based BIST Aiming at 100x Compression Rate."

Masayuki Arai et al. (2008)

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DOI: 10.1093/IETISY/E91-D.3.726

access: closed

type: Journal Article

metadata version: 2020-04-11

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Masayuki Arai, Satoshi Fukumoto, Kazuhiko Iwasaki, Tatsuru Matsuo, Takahisa Hiraide, Hideaki Konishi, Michiaki Emori, Takashi Aikyo:
Test Data Compression for Scan-Based BIST Aiming at 100x Compression Rate. IEICE Trans. Inf. Syst. 91-D(3): 726-735 (2008)

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