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Brady Benware
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2010 – 2019
- 2018
- [c30]Naixing Wang, Irith Pomeranz, Brady Benware, M. Enamul Amyeen, Srikanth Venkataraman:
Improving the Resolution of Multiple Defect Diagnosis by Removing and Selecting Tests. DFT 2018: 1-6 - 2017
- [c29]Wu-Tung Cheng, Randy Klingenberg, Brady Benware, Wu Yang, Manish Sharma, Geir Eide, Yue Tian, Sudhakar M. Reddy, Yan Pan, Sherwin Fernandes, Atul Chittora:
Automatic Identification of Yield Limiting Layout Patterns Using Root Cause Deconvolution on Volume Scan Diagnosis Data. ATS 2017: 219-224 - [c28]Yu Huang, Brady Benware, Randy Klingenberg, Huaxing Tang, Jayant Dsouza, Wu-Tung Cheng:
Scan Chain Diagnosis Based on Unsupervised Machine Learning. ATS 2017: 225-230 - 2015
- [c27]Huaxing Tang, Ting-Pu Tai, Wu-Tung Cheng, Brady Benware, Friedrich Hapke:
Diagnosing timing related cell internal defects for FinFET technology. VLSI-DAT 2015: 1-4 - 2014
- [c26]Huaxing Tang, Brady Benware, Michael Reese, Joseph Caroselli, Thomas Herrmann, Friedrich Hapke, Robert Tao, Wu-Tung Cheng, Manish Sharma:
Diagnosing Cell Internal Defects Using Analog Simulation-Based Fault Models. ATS 2014: 318-323 - [c25]Yen-Tzu Lin, Brady Benware, Brian Stine, Azeez Bhavnagarwala:
Innovative practices session 2C: Advanced in yield learning. VTS 2014: 1 - 2013
- [c24]Yu Huang, Xiaoxin Fan, Huaxing Tang, Manish Sharma, Wu-Tung Cheng, Brady Benware, Sudhakar M. Reddy:
Distributed dynamic partitioning based diagnosis of scan chain. VTS 2013: 1-6 - 2012
- [j6]Brady Benware, Chris Schuermyer, Manish Sharma, Thomas Herrmann:
Determining a Failure Root Cause Distribution From a Population of Layout-Aware Scan Diagnosis Results. IEEE Des. Test Comput. 29(1): 8-18 (2012) - [c23]Xiaoxin Fan, Huaxing Tang, Yu Huang, Wu-Tung Cheng, Sudhakar M. Reddy, Brady Benware:
Improved volume diagnosis throughput using dynamic design partitioning. ITC 2012: 1-10 - 2011
- [j5]Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer:
Fault Diagnosis with Orthogonal Compactors in Scan-Based Designs. J. Electron. Test. 27(5): 599-609 (2011) - [c22]Xiaoxin Fan, Huaxing Tang, Sudhakar M. Reddy, Wu-Tung Cheng, Brady Benware:
On Using Design Partitioning to Reduce Diagnosis Memory Footprint. Asian Test Symposium 2011: 219-225 - [c21]Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer:
Diagnosis of Failing Scan Cells through Orthogonal Response Compaction. ETS 2011: 1-6 - [c20]Manish Sharma, Avijit Dutta, Wu-Tung Cheng, Brady Benware, Mark Kassab:
A novel Test Access Mechanism for failure diagnosis of multiple isolated identical cores. ITC 2011: 1-9 - 2010
- [j4]Manish Sharma, Chris Schuermyer, Brady Benware:
Determination of Dominant-Yield-Loss Mechanism with Volume Diagnosis. IEEE Des. Test Comput. 27(3): 54-61 (2010) - [c19]Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer:
Diagnosis of failing scan cells through orthogonal response compaction. ETS 2010: 221-226 - [c18]Yu Huang, Brady Benware, Wu-Tung Cheng, Ting-Pu Tai, Feng-Ming Kuo, Yuan-Shih Chen:
Case study of scan chain diagnosis and PFA on a low yield wafer. ITC 2010: 818
2000 – 2009
- 2009
- [c17]Ritesh P. Turakhia, Mark Ward, Sandeep Kumar Goel, Brady Benware:
Bridging DFM Analysis and Volume Diagnostics for Yield Learning - A Case Study. VTS 2009: 167-172 - 2008
- [c16]Wu-Tung Cheng, Brady Benware, Ruifeng Guo
, Kun-Han Tsai, Takeo Kobayashi, Kazuyuki Maruo, Michinobu Nakao, Yoshiaki Fukui, Hideyuki Otake:
Enhancing Transition Fault Model for Delay Defect Diagnosis. ATS 2008: 179-184 - [c15]Manish Sharma, Brady Benware, Lei Ling, David Abercrombie, Lincoln Lee, Martin Keim, Huaxing Tang, Wu-Tung Cheng, Ting-Pu Tai, Yi-Jung Chang, Reinhart Lin, Albert Mann:
Efficiently Performing Yield Enhancements by Identifying Dominant Physical Root Cause from Test Fail Data. ITC 2008: 1-9 - 2007
- [c14]Huaxing Tang, Manish Sharma, Janusz Rajski, Martin Keim, Brady Benware:
Analyzing Volume Diagnosis Results with Statistical Learning for Yield Improvement. ETS 2007: 145-150 - [c13]Chris Schuermyer, Jewel Pangilinan, Jay Jahangiri, Martin Keim, Janusz Rajski, Brady Benware:
Silicon Evaluation of Static Alternative Fault Models. VTS 2007: 265-270 - 2006
- [j3]Ritesh P. Turakhia, W. Robert Daasch, Joel Lurkins, Brady Benware:
Changing Test and Data Modeling Requirements for Screening Latent Defects as Statistical Outliers. IEEE Des. Test Comput. 23(2): 100-109 (2006) - [j2]Jeffrey E. Nelson, Thomas Zanon, Jason G. Brown, Osei Poku, R. D. (Shawn) Blanton, Wojciech Maly, Brady Benware, Chris Schuermyer:
Extracting Defect Density and Size Distributions from Product ICs. IEEE Des. Test Comput. 23(5): 390-400 (2006) - [c12]Martin Keim, Nagesh Tamarapalli, Huaxing Tang, Manish Sharma, Janusz Rajski, Chris Schuermyer, Brady Benware:
A Rapid Yield Learning Flow Based on Production Integrated Layout-Aware Diagnosis. ITC 2006: 1-10 - 2005
- [c11]Joel Lurkins, DeAnna Hill, Brady Benware:
Case study: effectiveness of high-speed scan based feed forward voltage testing in reducing DPPM on a high volume ASIC. ITC 2005: 7 - [c10]Chris Schuermyer, Kevin Cota, Robert Madge, Brady Benware:
Identification of systematic yield limiters in complex ASICS through volume structural test fail data visualization and analysis. ITC 2005: 9 - [c9]Robert Madge, Brady Benware, Mark Ward, W. Robert Daasch:
The value of statistical testing for quality, yield and test cost improvement. ITC 2005: 10 - [c8]Ritesh P. Turakhia, Brady Benware, Robert Madge, Thaddeus T. Shannon
, W. Robert Daasch:
Defect Screening Using Independent Component Analysis on I_DDQ. VTS 2005: 427-432 - 2004
- [c7]Robert Madge, Brady Benware, Ritesh P. Turakhia, W. Robert Daasch, Chris Schuermyer, Jens Ruffler:
In Search of the Optimum Test Set - Adaptive Test Methods for Maximum Defect Coverage and Lowest Test Cost. ITC 2004: 203-212 - [c6]Brady Benware, Cam Lu, John Van Slyke, Prabhu Krishnamurthy, Robert Madge, Martin Keim, Mark Kassab, Janusz Rajski:
Affordable and Effective Screening of Delay Defects in ASICs using the Inline Resistance Fault Model. ITC 2004: 1285-1294 - [c5]Brady Benware:
Achieving Sub 100 DPPM Defect Levels on VDSM and Nanometer ASICs. ITC 2004: 1418 - [c4]Ethan Long, W. Robert Daasch, Robert Madge, Brady Benware:
Detection of Temperature Sensitive Defects Using ZTC. VTS 2004: 185-192 - 2003
- [j1]Robert Madge, Brady Benware, W. Robert Daasch:
Obtaining High Defect Coverage for Frequency-Dependent Defects in Complex ASICs. IEEE Des. Test Comput. 20(5): 46-53 (2003) - [c3]Chris Schuermyer, Brady Benware, Kevin Cota, Robert Madge, W. Robert Daasch, L. Ning:
Screening VDSM Outliers using Nominal and Subthreshold Supply Voltage IDDQ. ITC 2003: 565-573 - [c2]Brady Benware, Chris Schuermyer, Sreenevasan Ranganathan, Robert Madge, Prabhu Krishnamurthy, Nagesh Tamarapalli, Kun-Han Tsai, Janusz Rajski:
Impact of Multiple-Detect Test Patterns on Product Quality. ITC 2003: 1031-1040 - [c1]Brady Benware, Robert Madge, Cam Lu, W. Robert Daasch:
Effectiveness Comparisons of Outlier Screening Methods for Frequency Dependent Defects on Complex ASICs. VTS 2003: 39-46
Coauthor Index
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