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John Van Slyke

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2000 – 2009

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2007
[c2]
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  dblp key:
  - conf/itc/TurakhiaDWS07
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  - https://dblp.org/rec/conf/itc/TurakhiaDWS07
Ritesh P. Turakhia, W. Robert Daasch, Mark Ward, John Van Slyke:
Silicon evaluation of longest path avoidance testing for small delay defects. ITC 2007: 1-10
2004
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Brady Benware, Cam Lu, John Van Slyke, Prabhu Krishnamurthy, Robert Madge, Martin Keim, Mark Kassab, Janusz Rajski:
Affordable and Effective Screening of Delay Defects in ASICs using the Inline Resistance Fault Model. ITC 2004: 1285-1294

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