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"Diagnosing timing related cell internal defects for FinFET technology."
Huaxing Tang et al. (2015)
- Huaxing Tang, Ting-Pu Tai, Wu-Tung Cheng, Brady Benware, Friedrich Hapke:
Diagnosing timing related cell internal defects for FinFET technology. VLSI-DAT 2015: 1-4
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