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Journal Articles
- 2013
[j14]Hector Villacorta, Charles F. Hawkins, Víctor H. Champac, Jaume Segura
, Roberto Gómez:
Reliability Analysis of Small-Delay Defects Due to Via Narrowing in Signal Paths. IEEE Des. Test 30(6): 70-79 (2013)- 2012
- [j13]Víctor H. Champac, Julio Vazquez Hernandez, Salvador Barceló, Roberto Gómez, Chuck Hawkins, Jaume Segura:
Testing of Stuck-Open Faults in Nanometer Technologies. IEEE Des. Test Comput. 29(4): 80-91 (2012) - 2003
- [j12]Ali Keshavarzi, Kaushik Roy, Charles F. Hawkins, Vivek De:
Multiple-parameter CMOS IC testing with increased sensitivity for IDDQ. IEEE Trans. Very Large Scale Integr. Syst. 11(5): 863-870 (2003) - 2002
- [j11]Ali Keshavarzi, James W. Tschanz, Siva G. Narendra, Vivek De, W. Robert Daasch, Kaushik Roy, Manoj Sachdev, Charles F. Hawkins:
Leakage and Process Variation Effects in Current Testing on Future CMOS Circuits. IEEE Des. Test Comput. 19(5): 36-43 (2002) - 2000
- [j10]Ali Keshavarzi, Kaushik Roy, Charles F. Hawkins:
Intrinsic leakage in deep submicron CMOS ICs-measurement-based test solutions. IEEE Trans. Very Large Scale Integr. Syst. 8(6): 717-723 (2000) - 1999
- [j9]Charles F. Hawkins, Jaume Segura:
Test and Reliability: Partners in IC Manufacturing, Part 1. IEEE Des. Test Comput. 16(3): 64-71 (1999) - [j8]Charles F. Hawkins, Jerry M. Soden:
Deep Submicron CMOS Current IC Testing: Is There a Future? IEEE Des. Test Comput. 16(4): 14-15 (1999) - [j7]Charles F. Hawkins, Jaume Segura, Jerry M. Soden, Ted Dellin:
Test and Reliability: Partners in IC Manufacturing, Part 2. IEEE Des. Test Comput. 16(4): 66-73 (1999) - 1996
- [j6]Jerry M. Soden, Charles F. Hawkins:
IDDQ Testing: Issues Present and Future. IEEE Des. Test Comput. 13(4): 61-65 (1996) - [j5]Jaume Segura, Carol de Benito, Antonio Rubio, Charles F. Hawkins:
A detailed analysis and electrical modeling of gate oxide shorts in MOS transistors. J. Electron. Test. 8(3): 229-239 (1996) - 1995
- [j4]Charles F. Hawkins, Jerry M. Soden:
IDDQ Design and Test Advantages Propel Industry. IEEE Des. Test Comput. 12(2): 40-41 (1995) - 1992
- [j3]Ravi K. Gulati, Charles F. Hawkins:
Introduction. J. Electron. Test. 3(4): 289 (1992) - [j2]Jerry M. Soden, Charles F. Hawkins, Ravi K. Gulati, Weiwei Mao:
IDDQ testing: A review. J. Electron. Test. 3(4): 291-303 (1992) - 1986
- [j1]Jerry M. Soden, Charles F. Hawkins:
Test Considerations for Gate Oxide Shorts in CMOS ICs. IEEE Des. Test 3(4): 56-64 (1986)
Conference and Workshop Papers
- 2010
- [c33]Hector Villacorta, Víctor H. Champac, Chuck Hawkins, Jaume Segura:
Reliability analysis of small delay defects in vias located in signal paths. LATW 2010: 1-6 - 2009
- [c32]Roberto Gómez, Víctor H. Champac, Chuck Hawkins, Jaume Segura:
A modern look at the CMOS stuck-open fault. LATW 2009: 1-6 - [c31]Julio César Vázquez, Víctor H. Champac, Chuck Hawkins, Jaume Segura:
Stuck-Open Fault Leakage and Testing in Nanometer Technologies. VTS 2009: 315-320 - 2006
- [c30]Chuck Hawkins:
Parametric Failures and Detection Strategies. LATW 2006: 126 - 2005
- [c29]Chuck Hawkins, Jaume Segura:
The anatomy of nanometer timing failures. ETS 2005: 210-215 - 2003
- [c28]Charles F. Hawkins, Ali Keshavarzi, Jaume Segura:
CMOS IC nanometer technology failure mechanisms. CICC 2003: 605-611 - [c27]Charles F. Hawkins, Ali Keshavarzi, Jaume Segura:
A View from the Bottom: Nanometer Technology AC Parametric Failures -- Why, Where, and How to Detect. DFT 2003: 267- - [c26]Oleg Semenov, Arman Vassighi, Manoj Sachdev, Ali Keshavarzi, Charles F. Hawkins:
Burn-in Temperature Projections for Deep Sub-micron Technologies. ITC 2003: 95-104 - 2002
- [c25]Jaume Segura, Ali Keshavarzi, Jerry M. Soden, Charles F. Hawkins:
Parametric Failures in CMOS ICs - A Defect-Based Analysis. ITC 2002: 90-99 - [c24]Bartomeu Alorda, M. Rosales, Jerry M. Soden, Charles F. Hawkins, Jaume Segura:
Charge Based Transient Current Testing (CBT) for Submicron CMOS SRAMs. ITC 2002: 947-953 - [c23]Chuck Hawkins, Jaume Segura:
GHz Testing and Its Fuzzy Targets. ITC 2002: 1228 - 2001
- [c22]Ivan de Paúl, M. Rosales, Bartomeu Alorda, Jaume Segura, Charles F. Hawkins, Jerry M. Soden:
Defect Oriented Fault Diagnosis for Semiconductor Memories using Charge Analysis: Theory and Experiments. VTS 2001: 286-291 - 2000
- [c21]Ali Keshavarzi, Kaushik Roy, Charles F. Hawkins, Manoj Sachdev, Krishnamurthy Soumyanath, Vivek De:
Multiple-parameter CMOS IC testing with increased sensitivity for I_DDQ. ITC 2000: 1051-1059 - 1999
- [c20]Ali Keshavarzi, Siva G. Narendra, Shekhar Borkar, Charles F. Hawkins, Kaushik Roy, Vivek De:
Technology scaling behavior of optimum reverse body bias for standby leakage power reduction in CMOS IC's. ISLPED 1999: 252-254 - 1998
- [c19]Alan W. Righter, Charles F. Hawkins, Jerry M. Soden, Peter C. Maxwell:
CMOS IC reliability indicators and burn-in economics. ITC 1998: 194-203 - 1997
- [c18]Edward I. Cole Jr., Jerry M. Soden, Paiboon Tangyunyong, Patrick L. Candelaria, Richard W. Beegle, Daniel L. Barton, Christopher L. Henderson, Charles F. Hawkins:
Transient Power Supply Voltage (VDDT) Analysis for Detecting IC Defects. ITC 1997: 23-31 - [c17]Ali Keshavarzi, Kaushik Roy, Charles F. Hawkins:
Intrinsic Leakage in Low-Power Deep Submicron CMOS ICs. ITC 1997: 146-155 - 1995
- [c16]Jaume Segura, Carol de Benito, Antonio Rubio, Charles F. Hawkins:
A Detailed Analysis of GOS Defects in MOS Transistors: Testing Implications at Circuit Level. ITC 1995: 544-551 - 1994
- [c15]Charles F. Hawkins, Jerry M. Soden, Alan W. Righter, F. Joel Ferguson:
Defect Classes - An Overdue Paradigm for CMOS IC. ITC 1994: 413-425 - 1993
- [c14]Richard H. Williams, Charles F. Hawkins:
The Economics of Guardband Placement. ITC 1993: 218-225 - [c13]Jerry M. Soden, Charles F. Hawkins:
Quality Testing Requires Quality Thinking. ITC 1993: 596 - [c12]Kenneth M. Wallquist, Alan W. Righter, Charles F. Hawkins:
A General Purpose IDDQ Measurement Circuit. ITC 1993: 642-651 - 1992
- [c11]Richard H. Williams, R. Glenn Wagner, Charles F. Hawkins:
Testing Errors: Data and Calculations in an IC Manufacturing Process. ITC 1992: 352-361 - [c10]Christopher L. Henderson, Richard H. Williams, Charles F. Hawkins:
Economic Impact of Type I Test Errors at System and Board Levels. ITC 1992: 444-452 - [c9]Charles F. Hawkins:
System Testing: The Future for All of Us. ITC 1992: 548 - 1991
- [c8]Christopher L. Henderson, Jerry M. Soden, Charles F. Hawkins:
The Behavior and Testing Implications of CMOS IC Logic Gate Open Circuits. ITC 1991: 302-310 - [c7]Charles F. Hawkins, Richard H. Williams:
EE Curriculum - Continuous Process Improvement? ITC 1991: 1118 - 1990
- [c6]Jerry M. Soden, Ronald R. Fritzemeier, Charles F. Hawkins:
Zero defects or zero stuck-at faults-CMOS IC process improvement with IDDQ. ITC 1990: 255-256 - [c5]Ronald R. Fritzemeier, Jerry M. Soden, R. Keith Treece, Charles F. Hawkins:
Increased CMOS IC stuck-at fault coverage with reduced I DDQ test sets. ITC 1990: 427-435 - [c4]Richard H. Williams, Charles F. Hawkins:
Errors in testing. ITC 1990: 1018-1027 - 1989
- [c3]Jerry M. Soden, R. Keith Treece, Michael R. Taylor, Charles F. Hawkins:
CMOS IC Stuck-Open Fault Electrical Effects and Design Considerations. ITC 1989: 423-430 - 1986
- [c2]Jerry M. Soden, Charles F. Hawkins:
Reliability and Electrical Properties of Gate Oxide Shorts in CMOS ICs. ITC 1986: 443-451 - 1985
- [c1]Jerry M. Soden, Charles F. Hawkins:
Electrical Characteristics and Testing Considerations for Gate Oxide Shorts in CMOS ICs. ITC 1985: 544-557
Coauthor Index
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