"Leakage and Process Variation Effects in Current Testing on Future CMOS ..."

Ali Keshavarzi et al. (2002)

Details and statistics

DOI: 10.1109/MDT.2002.1033790

access: closed

type: Journal Article

metadata version: 2022-02-28

a service of  Schloss Dagstuhl - Leibniz Center for Informatics