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"Increased CMOS IC stuck-at fault coverage with reduced I DDQ ..."
Ronald R. Fritzemeier et al. (1990)
- Ronald R. Fritzemeier, Jerry M. Soden, R. Keith Treece, Charles F. Hawkins:
Increased CMOS IC stuck-at fault coverage with reduced I DDQ test sets. ITC 1990: 427-435
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