"Toggle-Masking for Test-per-Scan VLSI Circuits."

Nitin Parimi, Xiaoling Sun (2004)

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DOI: 10.1109/DFT.2004.61

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type: Conference or Workshop Paper

metadata version: 2023-03-24

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Nitin Parimi, Xiaoling Sun:
Toggle-Masking for Test-per-Scan VLSI Circuits. DFT 2004: 332-338

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