13. Asian Test Symposium 2004: Kenting, Taiwan

Session A1: SOC Testing

Session B1: Low-Power Testing

Session C1: Analog BIST

Session A2: Advanced DFT

Session B2: Fault Analysis

Session C2: Cross-Talk Testing

Session A3: Functional Testing

Session B3: Logic BIST

Session C3: Fault Diagnosis

Session A4: SOC Test Scheduling

Session B4: Memory Testing

Session C4: Analog Testing

Session A5: Testable Design

Session B5: Testability Analysis

Session C5: Yield and Reliability

Session A6: Fault Tolerance

Session B6: FPGA Testing and Test Reduction

Session C6: Delay Testing

maintained by Schloss Dagstuhl LZI at University of Trier