"Max-Testable Class of Sequential Circuits having Combinational Test ..."

Debesh Kumar Das et al. (2004)

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DOI: 10.1109/ATS.2004.57

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Debesh Kumar Das, Tomoo Inoue, Susanta Chakraborty, Hideo Fujiwara:
Max-Testable Class of Sequential Circuits having Combinational Test Generation Complexity. Asian Test Symposium 2004: 342-347

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