"Rapid and Energy-Efficient Testing for Embedded Cores."

Yinhe Han et al. (2004)

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DOI: 10.1109/ATS.2004.72

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-23

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Yinhe Han, Yu Hu, Huawei Li, Xiaowei Li, Anshuman Chandra:
Rapid and Energy-Efficient Testing for Embedded Cores. Asian Test Symposium 2004: 8-13

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