• case-insensitive prefix search: default
  e.g., sig matches "SIGIR" as well as "signal"
• exact word search: append dollar sign ($) to word
  e.g., graph$ matches "graph", but not "graphics"
• boolean and: separate words by space
  e.g., codd model
• boolean or: connect words by pipe symbol (|)
  e.g., graph|network

Update May 7, 2017: Please note that we had to disable the phrase search operator (.) and the boolean not operator (-) due to technical problems. For the time being, phrase search queries will yield regular prefix search result, and search terms preceded by a minus will be interpreted as regular (positive) search terms.

found 92 matches

• 1998
• 
  Md. Altaf-Ul-Amin, Zahari Mohamed Darus:
  An Off-Chip Current Sensor for IDDQ Testing of CMOS ICs. Asian Test Symposium 1998: 318-322
• 
  Vladimir Castro Alves, Felipe M. G. França, Edson do Prado Granja:
  A BIST Scheme for Asynchronous Logic. Asian Test Symposium 1998: 27-32
• 
  Bechir Ayari, Prab Varma:
  Test Cycle Count Reduction in a Parallel Scan BIST Environment. Asian Test Symposium 1998: 21-26
• 
  Florence Azaïs, André Ivanov, Michel Renovell, Yves Bertrand:
  A Methodology and Design for Effective Testing of Voltage-Controlled Oscillators (VCOs. Asian Test Symposium 1998: 383-387
• 
  S. M. Aziz, Joarder Kamruzzaman:
  Fault Characterization of Low Capacitance Full-Swing BiCMOS Logic Circuits. Asian Test Symposium 1998: 119-
• 
  Ismet Bayraktaroglu, K. Udawatta, Alex Orailoglu:
  An Examination of PRPG Selection Approaches for Large, Industrial Designs. Asian Test Symposium 1998: 440-
• 
  Surendra Bommu, Srimat T. Chakradhar, Kiran B. Doreswamy:
  Vector Restoration Using Accelerated Validation and Refinement. Asian Test Symposium 1998: 458-466
• 
  Paulo Sérgio Cardoso, Marius Strum, José Roberto de A. Amazonas, Jiang Chau Wang:
  A Methodology for Minimum Area Cellular Automata Generation. Asian Test Symposium 1998: 33-
• 
  Yue-Tsang Chen, Chauchin Su:
  Analog Module Metrology Using MNABST-1 P1149.4 Test Chip. Asian Test Symposium 1998: 378-382
• 
  Chen-Huan Chiang, Sandeep K. Gupta:
  BIST TPG for Combinational Cluster (Glue Logic) Interconnect Testing at Board Level. Asian Test Symposium 1998: 244-252
• 
  Silvia Chiusano, Fulvio Corno, Paolo Prinetto:
  A Test Pattern Generation Algorithm Exploiting Behavioral Information. Asian Test Symposium 1998: 480-485
• 
  Kin Wee Choo, Guoxiao Guo, Ben M. Chen:
  Development of a Multi-Channel PC-Based Hard Disk Drive Bode-Plot Generator. Asian Test Symposium 1998: 184-
• 
  Yu-Chun Chuang, Cheng-Wen Wu:
  On-Line Error Detection Schemes for a Systolic Finite-Field Inverter. Asian Test Symposium 1998: 301-305
• 
  Terry Corpuz:
  Fast Window Test Method of Hysteresis Test. Asian Test Symposium 1998: 179-183
• 
  Vikram Devdas, André Ivanov:
  Non-Intrusive Testing of High-Speed CML Circuits. Asian Test Symposium 1998: 172-178
• 
  Chryssa Dislis, Gerry Musgrave, Roger B. Hughes:
  Formal Design Techniques - Theory and Engineering Reality. Asian Test Symposium 1998: 394-398
• 
  Kent L. Einspahr, Shashank K. Mehta, Sharad C. Seth:
  Synthesis of Sequential Circuits with Clock Control to Improve Testability. Asian Test Symposium 1998: 472-
• 
  Christophe Fagot, Olivier Gascuel, Patrick Girard, Christian Landrault:
  A Ring Architecture Strategy for BIST Test Pattern Generation. Asian Test Symposium 1998: 418-423
• 
  Mark G. Faust:
  ATE Features for IDDQ Testing. Asian Test Symposium 1998: 153-
• 
  Wenyi Feng, Wei-Kang Huang, Fred J. Meyer, Fabrizio Lombardi:
  Fault Detection in a Tristate System Environment. Asian Test Symposium 1998: 253-258
• 
  Marie-Lise Flottes, R. Pires, Bruno Rouzeyre:
  Alleviating DFT Cost Using Testability Driven HLS. Asian Test Symposium 1998: 46-51
• 
  Eric Mouchel La Fosse:
  A Structured Testing Approach for DSP Software. Asian Test Symposium 1998: 131-
• 
  Marwan A. Gharaybeh, Vishwani D. Agrawal, Michael L. Bushnell:
  False-Path Removal Using Delay Fault Simulation. Asian Test Symposium 1998: 82-87
• 
  Patrick Girard, Christian Landrault, V. Moreda, Serge Pravossoudovitch, Arnaud Virazel:
  A BIST Structure to Test Delay Faults in a Scan Environment. Asian Test Symposium 1998: 435-439
• 
  J. Gong, Eddie M. C. Wong:
  Verification of Asynchronous Circuits with Bounded Inertial Gate Delays. Asian Test Symposium 1998: 399-401
• 
  Ad J. van de Goor:
  Answers to the Key Issues. Asian Test Symposium 1998: 520
• 
  Zhen Guo, He Li, Shuling Guo, Dongsheng Wang:
  Design and Simulation of a RISC-Based 32-bit Embedded On-Board Computer. Asian Test Symposium 1998: 413-
• 
  Ruifeng Guo, Irith Pomeranz, Sudhakar M. Reddy:
  On Speeding-Up Vector Restoration Based Static Compaction of Test Sequences for Sequential Circuits . Asian Test Symposium 1998: 467-471
• 
  Said Hamdioui, Ad J. van de Goor:
  Consequences of Port Restriction on Testing Address Decoders in Two-Port Memories. Asian Test Symposium 1998: 340-347
• 
  Masaki Hashizume, Yukiya Miura, Masahiro Ichimiya, Takeomi Tamesada, Kozo Kinoshita:
  A High-Speed IDDQ Sensor for Low-Voltage ICs. Asian Test Symposium 1998: 327-

skipping 62 more matches