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Publication search results
found 2,091 matches
- 2024
- Haruo Kobayashi, Naoki Tsukahara, Keno Sato, Takashi Oshima:
Innovative Practices Session at VLSI Test Symposium 2024: Analog Testing Technologies for Digital Exploding Society. VTS 2024: 1 - N. Afroz, A. Sayem, Georgios Volanis, Dzmitry Maliuk, Haralampos-G. Stratigopoulos, Yiorgos Makris:
On the Sensitivity of Analog Artificial Neural Network Models to Process Variation. VTS 2024: 1-7 - Mohammad Hasan Ahmadilivani, Alberto Bosio, Bastien Deveautour, Fernando Fernandes dos Santos, Juan-David Guerrero-Balaguera, Maksim Jenihhin, Angeliki Kritikakou, Robert Limas Sierra, Salvatore Pappalardo, Jaan Raik, Josie E. Rodriguez Condia, Matteo Sonza Reorda, Mahdi Taheri, Marcello Traiola:
Special Session: Reliability Assessment Recipes for DNN Accelerators. VTS 2024: 1-11 - Soyed Tuhin Ahmed, Surendra Hemaram, Mehdi B. Tahoori:
NN-ECC: Embedding Error Correction Codes in Neural Network Weight Memories using Multi-task Learning. VTS 2024: 1-7 - Ferhat Can Ataman, Mohammed Aladsani, Y. B. Chethan Kumar, Georgios C. Trichopoulos, Sule Ozev:
Multi-Parameter Optimization of mm-Wave Antenna Layout Using Hybrid Modeling and Incremental Model Learning. VTS 2024: 1-5 - Tommaso Baldi, Javier Campos, Benjamin Hawks, Jennifer Ngadiuba, Nhan Tran, Daniel Diaz, Javier M. Duarte, Ryan Kastner, Andres Meza, Melissa Quinnan, Olivia Weng, Caleb Geniesse, Amir Gholami, Michael W. Mahoney, Vladimir Loncar, Philip C. Harris, Joshua Agar, Shuyu Qin:
Reliable edge machine learning hardware for scientific applications. VTS 2024: 1-5 - Ishaan Bassi, Sule Ozev:
Calibration and Source Localization Using an Array of Resistive Metal Oxide Gas Sensors. VTS 2024: 1-7 - Sumukh Prashant Bhanushali, Tushar Gupta, Debnath Maiti, Arindam Sanyal:
Machine Learning Based Static and Dynamic Error Calibration in Data Converters. VTS 2024: 1-4 - Duane Brown, Ira Leventhal, Sri Ganta, Keith Schaub:
Innovative Practices Track: Session 6 - Using AI to Address the Silicon Growth Curve. VTS 2024: 1 - Vidya A. Chhabria, Wenjing Jiang, Andrew B. Kahng, Rongjian Liang, Haoxing Ren, Sachin S. Sapatnekar, Bing-Yue Wu:
OpenROAD and CircuitOps: Infrastructure for ML EDA Research and Education. VTS 2024: 1-4 - Sanjay Das, Shamik Kundu, Anand Menon, Yihui Ren, Shubha R. Kharel, Kanad Basu:
Analyzing and Mitigating Circuit Aging Effects in Deep Learning Accelerators. VTS 2024: 1-7 - Nourhan Elhamawy, Jens Anders, Ilia Polian, Matthias Sauer:
Scenario-based Test Content Optimization: Scan Test vs. System-Level Test. VTS 2024: 1-7 - Abdullah Eroglu, M. N. Mahmoud:
Artificial Intelligence Based High Power Calibration Method for RF Pulse Amplifiers. VTS 2024: 1-5 - Ryan F. Forelli, Rui Shi, Seda Ogrenci, Joshua Agar:
A High Level Synthesis Methodology for Dynamic Monitoring of FPGA ML Accelerators. VTS 2024: 1-5 - Valentin Gherman, Cyrille Laffond:
Sequential Decoders for Binary Linear Block ECCs. VTS 2024: 1-5 - Subashini Gopalsamy, Irith Pomeranz:
A Storage Based LBIST Scheme for Logic Diagnosis. VTS 2024: 1-7 - Juan-David Guerrero-Balaguera, Josie E. Rodriguez Condia, Marco Levorato, Matteo Sonza Reorda:
Evaluating the Reliability of Supervised Compression for Split Computing. VTS 2024: 1-6 - Ian Hill, Mateo Rendón, André Ivanov:
Enhanced Wear-Out Sensor Design in a 12nm Process for Separable Stress Regime Monitoring. VTS 2024: 1-7 - Shao-Chun Hung, Partho Bhoumik, Krishnendu Chakrabarty:
Testing and Fault Diagnosis for Multi-level Resistive Random-Access Memory in Monolithic 3D Integration. VTS 2024: 1-7 - Apurva Jain, Thomas Broadfoot, Carl Sechen, Yiorgos Makris:
Testing a Transistor-Level Programmable Fabric: Challenges and Solutions. VTS 2024: 1-7 - Rahul Kande, Vasudev Gohil, Matthew DeLorenzo, Chen Chen, Jeyavijayan Rajendran:
LLMs for Hardware Security: Boon or Bane? VTS 2024: 1-4 - Suhas Krishna Kashyap, Chinmaye Raghavendra, Suriyaprakash Natarajan, Sule Ozev:
Structural Built In Self Test of Analog Circuits using ON/OFF Keying and Delay Monitors. VTS 2024: 1-7 - Xunyu Li, Weiquan Hao, Zijin Pan, Yunru Miao, Zijian Yue, Albert Z. Wang:
Practical Considerations on ESD Testing. VTS 2024: 1-3 - Mingye Li, Yunkun Lin, Sandeep Gupta:
Built in self test (BIST) for RSFQ circuits. VTS 2024: 1-7 - Mingjie Liu, Minwoo Kang, Ghaith Bany Hamad, Syed Suhaib, Haoxing Ren:
Domain-Adapted LLMs for VLSI Design and Verification: A Case Study on Formal Verification. VTS 2024: 1-4 - Cheng-Che Lu, Chi-Chih Chang, Chia-Heng Yen, Shuo-Wen Chang, Ying-Hua Chu, Kai-Chiang Wu, Mango Chia-Tso Chao:
Transformer and Its Variants for Identifying Good Dice in Bad Neighborhoods. VTS 2024: 1-7 - Yingyi Luo, Talha M. Khan, Emadeldeen Hamdan, Xin Zhu, Hongyi Pan, Didem Ozevin, A. Enis Çetin:
AlN Sputtering Parameter Estimation Using A Multichannel Parallel DCT Neural Network. VTS 2024: 1-5 - Sina Bakhtavari Mamaghani, Jongsin Yun, Martin Keim, Mehdi B. Tahoori:
Multi-Level Reference for Test Coverage Enhancement of Resistive-Based NVM. VTS 2024: 1-7 - Erik Jan Marinissen, Vineet Pancholi, Po-Yao Chuang, Martin Keim:
IEEE Std P3405: New Standard-under-Development for Chiplet Interconnect Test and Repair. VTS 2024: 1-11 - Mahta Mayahinia, Haneen G. Hezayyin, Mehdi B. Tahoori:
Reliability analysis and mitigation for analog computation-in-memory: from technology to application. VTS 2024: 1-7
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