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"Structural Built In Self Test of Analog Circuits using ON/OFF Keying and ..."

Suhas Krishna Kashyap et al. (2024)

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DOI: 10.1109/VTS60656.2024.10538672

access: closed

type: Conference or Workshop Paper

metadata version: 2024-06-03

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Suhas Krishna Kashyap, Chinmaye Raghavendra, Suriyaprakash Natarajan, Sule Ozev:
Structural Built In Self Test of Analog Circuits using ON/OFF Keying and Delay Monitors. VTS 2024: 1-7

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