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Journal Articles
- 2023
[j14]Tiago R. Balen
, Carlos J. González, Ingrid F. V. Oliveira, Leomar S. da Rosa Jr., Rafael Iankowski Soares, Rafael B. Schvittz, Nemitala Added, Eduardo L. A. Macchione, Vitor A. P. Aguiar, Marcilei Aparecida Guazzelli, Nilberto H. Medina, Paulo F. Butzen:
Evaluating the Reliability of Different Voting Schemes for Fault Tolerant Approximate Systems. J. Electron. Test. 39(4): 409-420 (2023)- [j13]Gustavo Paz Platcheck, Guilherme Schwanke Cardoso, Tiago Roberto Balen:
Pseudosymmetric Enclosed Layout Transistors for Radiation Hardened Analog Applications. IEEE Trans. Aerosp. Electron. Syst. 59(2): 2072-2076 (2023) - 2021
- [j12]Carlos J. González, Bruno L. Costa, Diego N. Machado, Rafael Galhardo Vaz, Alexis C. Vilas Bôas, Odair Lelis Gonçalez, Helmut Puchner, Fernanda Lima Kastensmidt, Nilberto H. Medina, Marcilei Aparecida Guazzelli, Tiago Roberto Balen:
Failure Mechanism and Sampling Frequency Dependency on TID Response of SAR ADCs. J. Electron. Test. 37(3): 329-343 (2021) - [j11]Thiago Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Letícia Maria Bolzani Poehls, Tiago Roberto Balen:
Evaluation of Single Event Upset Susceptibility of FinFET-based SRAMs with Weak Resistive Defects. J. Electron. Test. 37(3): 383-394 (2021) - 2020
- [j10]Thiago Copetti, Tiago R. Balen, E. Brum, C. Aquistapace, Leticia Bolzani Poehls:
Comparing the Impact of Power Supply Voltage on CMOS- and FinFET-Based SRAMs in the Presence of Resistive Defects. J. Electron. Test. 36(2): 271-284 (2020) - [j9]Leonardo Bisch Piccoli, Renato V. B. Henriques, Tiago R. Balen:
Design of an Integrated System for On-line Test and Diagnosis of Rotary Actuators. J. Electron. Test. 36(4): 547-553 (2020) - 2019
- [j8]G. Cardoso Medeiros, E. Brum, Leticia Bolzani Poehls, Thiago Copetti, Tiago R. Balen:
Evaluating the Impact of Temperature on Dynamic Fault Behaviour of FinFET-Based SRAMs with Resistive Defects. J. Electron. Test. 35(2): 191-200 (2019) - 2017
- [j7]Thales E. Becker, Alisson J. C. Lanot, Guilherme Schwanke Cardoso, Tiago R. Balen:
Single event transient effects on charge redistribution SAR ADCs. Microelectron. Reliab. 73: 22-35 (2017) - 2016
- [j6]Daniel Fusco, Tiago R. Balen:
Radiation Effects in Low Power and Ultra-Low Power Voltage References. J. Low Power Electron. 12(4): 403-412 (2016) - 2015
- [j5]Cristiano P. Chenet, Lucas A. Tambara, Gabriel de M. Borges, Fernanda Lima Kastensmidt, Marcelo Soares Lubaszewski, Tiago R. Balen:
Exploring design diversity redundancy to improve resilience in mixed-signal systems. Microelectron. Reliab. 55(12): 2833-2844 (2015) - 2011
- [j4]Luiz Fernando Gonçalves, Jefferson Luiz Bosa, Tiago Roberto Balen, Marcelo Lubaszewski, Eduardo Luis Schneider, Renato V. B. Henriques:
Fault Detection, Diagnosis and Prediction in Electrical Valves Using Self-Organizing Maps. J. Electron. Test. 27(4): 551-564 (2011) - 2007
- [j3]Tiago R. Balen, José Vicente Calvano, Marcelo Lubaszewski, Michel Renovell:
Built-In Self-Test of Field Programmable Analog Arrays based on Transient Response Analysis. J. Electron. Test. 23(6): 497-512 (2007) - 2005
- [j2]Tiago R. Balen, Antonio Q. Andrade, Florence Azaïs, Marcelo Lubaszewski, Michel Renovell:
Applying the Oscillation Test Strategy to FPAA's Configurable Analog Blocks. J. Electron. Test. 21(2): 135-146 (2005) - [j1]Antonio Andrade Jr., Gustavo Vieira, Tiago R. Balen, Marcelo Lubaszewski, Florence Azaïs, Michel Renovell:
Built-in self-test of global interconnects of field programmable analog arrays. Microelectron. J. 36(12): 1112-1123 (2005)
Conference and Workshop Papers
- 2024
- [c40]Clayton R. Farias, Tiago R. Balen, Paulo F. Butzen:
Cross-Section Estimation for Assessment of Circuit Susceptibility to Radiation. LATS 2024: 1-6 - [c39]Gustavo Paz Platcheck, Guilherme Schwanke Cardoso, Tiago R. Balen:
Behavioral and Variability Analysis of Enclosed Layout Transistors for Radiation Hardened Analog Circuits. LATS 2024: 1-6 - 2023
- [c38]Állan G. Ferreira, Lucas B. Zilch, Vinícius Navarro, Marcelo Soares Lubaszewski, Tiago R. Balen:
Towards a Machine Learning Based Method for Indirect Test Generation of Mixed-Signal Circuits. SBCCI 2023: 1-6 - 2022
- [c37]Bruno Canal, Hamilton Klimach, Sergio Bampi, Tiago R. Balen:
Hybrid Comparator and Window Switching Scheme for low-power SAR ADC. LASCAS 2022: 1-4 - [c36]Clayton R. Farias, Rafael B. Schvittz, Tiago R. Balen, Paulo F. Butzen:
Evaluating Soft Error Reliability of Combinational Circuits Using a Monte Carlo Based Method. LATS 2022: 1-6 - [c35]Lucas B. Zilch, Állan G. Ferreira, Marcelo Soares Lubaszewski, Tiago R. Balen:
Evaluating Fault Coverage of Structural and Specification-based Tests Obtained With a Low-Cost Analog TPG Tool. LATS 2022: 1-6 - [c34]Bruno Canal, Hamilton Duarte Klimach, Sergio Bampi, Tiago R. Balen:
Time Assisted SAR ADC with Bit-guess and Digital Error Correction. SBCCI 2022: 1-6 - [c33]Rodrigo N. Wuerdig, Bruno Canal, Tiago R. Balen, Sergio Bampi:
Designing a 9.3μW Low-Power Time-to-Digital Converter (TDC) for a Time Assisted SAR ADC. SBCCI 2022: 1-6 - 2021
- [c32]Tiago R. Balen, Carlos J. González, Ingrid F. V. Oliveira, Rafael B. Schvittz, Nemitala Added, Eduardo L. A. Macchione, Vitor A. P. de Aguiar, Marcilei Aparecida Guazzelli, Nilberto H. Medina, Paulo F. Butzen:
Reliability Evaluation of Voters for Fault Tolerant Approximate Systems. LATS 2021: 1-6 - 2020
- [c31]Thiago Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Leticia Bolzani Poehls, Tiago R. Balen:
Evaluating the Impact of Ionizing Particles on FinFET -based SRAMs with Weak Resistive Defects. LATS 2020: 1-6 - [c30]Bruno L. Costa, Carlos J. González, Rafael Galhardo Vaz, Odair Lelis Gonçalez, Tiago R. Balen:
Influence of sampling frequency on TID response of SAR ADCs. LATS 2020: 1-6 - [c29]Bruno Canal, Hamilton Duarte Klimach, Sergio Bampi, Tiago R. Balen:
Low-Voltage Dynamic Comparator with Bulk-Driven Floating Inverter Amplifier. SBCCI 2020: 1-6 - [c28]Gustavo Paz Platcheck, Guilherme Schwanke Cardoso, Tiago R. Balen:
Characterization of Enclosed Layout Transistors for Analog Applications on a130nm Technology. SBCCI 2020: 1-6 - 2019
- [c27]Thiago Santos Copetti, Tiago R. Balen, E. Brum, C. Aquistapace, Leticia Bolzani Poehls:
A Comparative Study Between FinFET and CMOS-Based SRAMs under Resistive Defects. LATS 2019: 1-6 - [c26]Luiz G. S. Dias, Carlos J. González, Fernando J. Boeira, Tiago R. Balen:
Electromagnetic Immunity Test of Analog-to-Digital Interfaces of a Mixed-Signal Programmable SoC. LATS 2019: 1-5 - 2018
- [c25]G. Cardoso Medeiros, E. Brum, Leticia Bolzani Poehls, Thiago Copetti, Tiago R. Balen:
Influence of temperature on dynamic fault behavior due to resistive defects in FinFET-based SRAMs. LATS 2018: 1-6 - 2017
- [c24]André Lucas Chinazzo, Paulo César Comassetto de Aguirre, Tiago R. Balen:
Low cost automatic test vector generation for structural analog testing. LATS 2017: 1-4 - [c23]Carlos J. González, Cristiano P. Chenet, Matheus Budelon, Rafael Galhardo Vaz, Odair Lelis Goncalez, Tiago R. Balen:
Evaluation of a mixed-signal design diversity system under radiation effects. LATS 2017: 1-6 - [c22]Thiago Santos Copetti, Tiago R. Balen, Guilherme Cardoso Medeiros, Letícia Maria Bolzani Poehls:
Analyzing the behavior of FinFET SRAMs with resistive defects. VLSI-SoC 2017: 1-6 - [c21]Thiago Santos Copetti, Guilherme Cardoso Medeiros, Letícia Maria Bolzani Poehls, Tiago R. Balen:
Evaluating the Impact of Resistive Defects on FinFET-Based SRAMs. VLSI-SoC (Selected Papers) 2017: 22-45 - 2016
- [c20]Guilherme Schwanke Cardoso, Tiago R. Balen:
Study of layout extraction accuracy on W/L estimation of ELT in analog design flow. LASCAS 2016: 279-282 - [c19]Daniel Fusco, Tiago R. Balen:
Radiation effects in low power and ultra low power voltage references. LATS 2016: 111-116 - [c18]Guilherme Schwanke Cardoso, Tiago R. Balen:
Performance evaluation of radiation hardened analog circuits based on Enclosed Layout geometry. LATS 2016: 123-128 - 2015
- [c17]Isis D. Bender, Guilherme Schwanke Cardoso, Arthur C. de Oliveira, Lucas C. Severo, Alessandro Girardi, Tiago R. Balen:
Testing fully differential amplifiers using common mode feedback circuit: A case study. LASCAS 2015: 1-4 - 2014
- [c16]Cristiano P. Chenet, Alisson J. C. Lanot, Tiago R. Balen:
Design diversity redundancy with spatial-temporal voting applied to data acquisition systems. LATW 2014: 1-6 - [c15]Alisson J. C. Lanot, Tiago R. Balen:
Analysis of the effects of single event transients on an SAR-ADC based on charge redistribution. LATW 2014: 1-5 - [c14]Alisson J. C. Lanot, Tiago R. Balen:
Reliability Analysis of a 130nm Charge Redistribution SAR ADC under Single Event Effects. SBCCI 2014: 17:1-17:7 - 2013
- [c13]Lucas A. Tambara, Fernanda Lima Kastensmidt, Paolo Rech, Tiago R. Balen, Marcelo Lubaszewski:
Neutron-induced single event effects analysis in a SAR-ADC architecture embedded in a mixed-signal SoC. ISVLSI 2013: 188-193 - 2012
- [c12]Guilherme Schwanke Cardoso, Tiago R. Balen, Marcelo Soares Lubaszewski, Rafael Galhardo Vaz, Odair Lelis Goncalez:
Impact of TID-induced threshold deviations in analog building-blocks of operational amplifiers. LATW 2012: 1-6 - 2011
- [c11]Tiago R. Balen, Guilherme Schwanke Cardoso, Odair Lelis Gonçalez, Marcelo Soares Lubaszewski:
Investigating the effects of transient faults in Programmable Capacitor Arrays. LATW 2011: 1-6 - 2010
- [c10]Gabriel de M. Borges, Luiz Fernando Gonçalves, Tiago R. Balen, Marcelo Lubaszewski:
Increasing reliability of programmable mixed-signal systems by applying design diversity redundancy. ETS 2010: 261 - [c9]Tiago R. Balen, Marcelo Lubaszewski:
Radiation effects on programmable analog devices and mitigation techniques. IOLTS 2010: 136 - [c8]Gabriel de M. Borges, Luiz Fernando Gonçalves, Tiago R. Balen, Marcelo Lubaszewski:
Diversity TMR: Proof of concept in a mixed-signal case. LATW 2010: 1-6 - [c7]Gabriel de M. Borges, Luiz Fernando Gonçalves, Tiago R. Balen, Marcelo Lubaszewski:
Evaluating the effectiveness of a mixed-signal TMR scheme based on design diversity. SBCCI 2010: 134-139 - 2009
- [c6]Franco Leite, Tiago R. Balen, Marcos Hervé, Marcelo Lubaszewski, Gilson I. Wirth:
Using Bulk Built-In Current Sensors and recomputing techniques to mitigate transient faults in microprocessors. LATW 2009: 1-6 - 2007
- [c5]Tiago R. Balen, Fernanda Lima Kastensmidt, Marcelo Lubaszewski, Michel Renovell:
Single Event Upset in SRAM-based Field Programmable Analog Arrays: Effects and Mitigation. ISVLSI 2007: 192-197 - 2006
- [c4]Tiago R. Balen, José Vicente Calvano, Marcelo Lubaszewski, Michel Renovell:
Functional Test of Field Programmable Analog Arrays. VTS 2006: 326-333 - 2005
- [c3]Gustavo Pereira, Antonio Andrade Jr., Tiago R. Balen, Marcelo Lubaszewski, Florence Azaïs, Michel Renovell:
Testing the Interconnect Networks and I/O Resources of Field Programmable Analog Arrays. VTS 2005: 389-394 - 2004
- [c2]Tiago R. Balen, Antonio Andrade Jr., Florence Azaïs, Michel Renovell, Marcelo Lubaszewski:
Testing the Configurable Analog Blocks of Field Programmable Analog Arrays. ITC 2004: 893-902 - [c1]Tiago R. Balen, Antonio Andrade Jr., Florence Azaïs, Marcelo Lubaszewski, Michel Renovell:
An Approach to the Built-In Self-Test of Field Programmable Analog Arrays. VTS 2004: 383-388
Coauthor Index
aka: Marcelo Soares Lubaszewski
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