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"Comparing the Impact of Power Supply Voltage on CMOS- and FinFET-Based ..."

Thiago Copetti et al. (2020)

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DOI: 10.1007/S10836-020-05869-2

access: closed

type: Journal Article

metadata version: 2020-09-11

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Thiago Copetti, Tiago R. Balen, E. Brum, C. Aquistapace, Leticia Bolzani Poehls:
Comparing the Impact of Power Supply Voltage on CMOS- and FinFET-Based SRAMs in the Presence of Resistive Defects. J. Electron. Test. 36(2): 271-284 (2020)

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