Journal of Electronic Testing, Volume 35

Volume 35, Number 1, February 2019

Volume 35, Number 2, April 2019

Volume 35, Number 3, June 2019

Volume 35, Number 4, August 2019

Volume 35, Number 5, October 2019

Special Issue on International Conference on VLSI Design and Embedded Systems

Volume 35, Number 6, December 2019

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