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"Low cost automatic test vector generation for structural analog testing."

André Lucas Chinazzo, Paulo César Comassetto de Aguirre, Tiago R. Balen (2017)

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DOI: 10.1109/LATW.2017.7906740

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-14

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  dblp key:
  - conf/latw/ChinazzoAB17
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André Lucas Chinazzo, Paulo César Comassetto de Aguirre, Tiago R. Balen:
Low cost automatic test vector generation for structural analog testing. LATS 2017: 1-4

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