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2010 – 2019
- 2014
[j8]Mohamed Ali Belaïd
, Ahmed M. Nahhas, M. Gares, K. Daoud, Olivier Latry:
Leakage current effects on N-MOSFETs after thermal ageing in pulsed life tests. Microelectron. J. 45(12): 1800-1805 (2014)- [j7]Mohamed Ali Belaïd, M. Gares, K. Daoud, Olivier Latry:
Performance drifts of N-MOSFETs under pulsed RF life test. Microelectron. Reliab. 54(9-10): 1851-1855 (2014) - 2012
- [c2]Mohamed Ali Belaïd, M. Gares, K. Daoud, Philippe Eudeline:
Failure analysis of hot-electron effect on power RF N-LDMOS transistors. DTIS 2012: 1-6 - 2011
- [j6]Mohamed Ali Belaïd, M. Gares, K. Daoud, Philippe Eudeline:
S-parameter performance degradation in power RF N-LDMOS devices due to hot carrier effects. Microelectron. Reliab. 51(9-11): 1551-1556 (2011)
2000 – 2009
- 2007
- [j5]Mohamed Ali Belaïd, K. Ketata, Karine Mourgues, M. Gares, Mohamed Masmoudi, Jérôme Marcon:
Reliability study of power RF LDMOS device under thermal stress. Microelectron. J. 38(2): 164-170 (2007) - [j4]Mohamed Ali Belaïd, K. Ketata, M. Gares, Karine Mourgues, Mohamed Masmoudi, Jérôme Marcon:
Comparative analysis of RF LDMOS capacitance reliability under accelerated ageing tests. Microelectron. Reliab. 47(1): 59-64 (2007) - [j3]M. Gares, Mohamed Ali Belaïd, Hichame Maanane, Mohamed Masmoudi, Jérôme Marcon, Karine Mourgues, Philippe Eudeline:
Study of hot-carrier effects on power RF LDMOS device reliability. Microelectron. Reliab. 47(9-11): 1394-1399 (2007) - 2006
- [j2]Mohamed Ali Belaïd, K. Ketata, Mohamed Masmoudi, M. Gares, Hichame Maanane, Jérôme Marcon:
Electrical parameters degradation of power RF LDMOS device after accelerated ageing tests. Microelectron. Reliab. 46(9-11): 1800-1805 (2006) - [j1]M. Gares, Hichame Maanane, Mohamed Masmoudi, Pierre Bertram, Jérôme Marcon, Mohamed Ali Belaïd, Karine Mourgues, C. Tolant, Philippe Eudeline:
Hot carrier reliability of RF N- LDMOS for S Band radar application. Microelectron. Reliab. 46(9-11): 1806-1811 (2006) - [c1]M. Gares, Hichame Maanane, Mohamed Ali Belaïd, Mohamed Masmoudi, Jérôme Marcon, Karine Mourgues, Pierre Bertram, Philippe Eudeline:
Impact de la Temperature sur la Fiabilite des Composants rf Ldmos de Puissance. CCECE 2006: 382-385
Coauthor Index
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