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"Leakage current effects on N-MOSFETs after thermal ageing in pulsed life ..."

Mohamed Ali Belaïd et al. (2014)

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DOI: 10.1016/J.MEJO.2014.06.002

access: closed

type: Journal Article

metadata version: 2022-10-02

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Mohamed Ali Belaïd, Ahmed M. Nahhas, M. Gares, K. Daoud, Olivier Latry:
Leakage current effects on N-MOSFETs after thermal ageing in pulsed life tests. Microelectron. J. 45(12): 1800-1805 (2014)

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