BibTeX record conf/dtis/BelaidGDE12

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@inproceedings{DBLP:conf/dtis/BelaidGDE12,
  author    = {Mohamed Ali Bela{\"{\i}}d and
               M. Gares and
               K. Daoud and
               Philippe Eudeline},
  title     = {Failure analysis of hot-electron effect on power {RF} {N-LDMOS} transistors},
  booktitle = {7th International Conference on Design {\&} Technology of Integrated
               Systems in Nanoscale Era, Tunis, Tunisia, May 16-18, 2012},
  pages     = {1--6},
  publisher = {{IEEE}},
  year      = {2012},
  url       = {https://doi.org/10.1109/DTIS.2012.6232981},
  doi       = {10.1109/DTIS.2012.6232981},
  timestamp = {Tue, 17 Aug 2021 21:08:14 +0200},
  biburl    = {https://dblp.org/rec/conf/dtis/BelaidGDE12.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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